RW

Robert Walker

SY Synopsys: 15 patents #39 of 2,302Top 2%
IN Intel: 5 patents #7,174 of 30,777Top 25%
Overall (All Time): #207,171 of 4,157,543Top 5%
21
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10936772 Methods for incremental circuit physical synthesis Mahesh A. Iyer, Vasudeva M. Kamath 2021-03-02
10339241 Methods for incremental circuit design legalization during physical synthesis Mahesh A. Iyer 2019-07-02
10296701 Retiming with fixed power-up states Mahesh A. Iyer, Vasudeva M. Kamath 2019-05-21
10255404 Retiming with programmable power-up states Mahesh A. Iyer, Vasudeva M. Kamath 2019-04-09
10162918 Integrated circuit retiming with selective modeling of flip-flop secondary signals Mahesh A. Iyer, Vasudeva M. Kamath 2018-12-25
9189583 Look-up based buffer tree synthesis Sanjay Dhar, Kok Kiong Lee, Sanjay V. Kumar, Prashant Saxena 2015-11-17
8621408 Progressive circuit evaluation for circuit optimization Mahesh A. Iyer, Sudipto Kundu 2013-12-31
8578321 Delta-slack propagation for circuit optimization Mahesh A. Iyer 2013-11-05
8527927 Zone-based area recovery in electronic design automation Mahesh A. Iyer 2013-09-03
8418116 Zone-based optimization framework for performing timing and design rule optimization Mahesh A. Iyer, Amir H. Mottaez 2013-04-09
8266570 Density-based area recovery in electronic design automation Mahesh A. Iyer 2012-09-11
6539536 Electronic design automation system and methods utilizing groups of multiple cells having loop-back connections for modeling port electrical characteristics Harbinder Singh, Denis Martin, Srinivas Ajjarapu 2003-03-25
6106568 Hierarchical scan architecture for design for test applications James Beausang, Chris Ellingham, Markus F. Robinson 2000-08-22
6067650 Method and apparatus for performing partial unscan and near full scan within design for test applications James Beausang, Kenneth D. Wagner 2000-05-23
6058252 System and method for generating effective layout constraints for a circuit design or the like Mark D. Noll, Kenneth E. Scott 2000-05-02
5949692 Hierarchical scan architecture for design for test applications James Beausang, Chris Ellingham, Markus F. Robinson 1999-09-07
5911493 Illuminated umbrella Leslie Ronald Wittenberg 1999-06-15
5903466 Constraint driven insertion of scan logic for implementing design for test within an integrated circuit design James Beausang, Chris Ellingham 1999-05-11
5831868 Test ready compiler for design for test synthesis James Beausang 1998-11-03
5703789 Test ready compiler for design for test synthesis James Beausang 1997-12-30
5696771 Method and apparatus for performing partial unscan and near full scan within design for test applications James Beausang, Kenneth D. Wagner 1997-12-09