Issued Patents All Time
Showing 26–37 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7768271 | Method for calibration of a vectorial network analyzer having more than two ports | Andrej Rumiantsev, Steffen Schott | 2010-08-03 |
| 7769555 | Method for calibration of a vectorial network analyzer | Andrej Rumiantsev, Steffen Schott | 2010-08-03 |
| 7741860 | Prober for testing magnetically sensitive components | Sebastian Giessmann, Stefan Kreissig | 2010-06-22 |
| 7733108 | Method and arrangement for positioning a probe card | Hans-Jurgen Fleischer, Stefan Kressig, Jorg Kiesewetter | 2010-06-08 |
| 7659743 | Method and apparatus for testing electronic components within horizontal and vertical boundary lines of a wafer | Jorg Kiesewetter | 2010-02-09 |
| 7652491 | Probe support with shield for the examination of test substrates under use of probe supports | Hans-Jurgen Fleischer, Stefan Kreissig, Karsten Stoll, Axel Schmidt, Andreas Kittlaus | 2010-01-26 |
| 7579849 | Probe holder for a probe for testing semiconductor components | Jorg Kiesewetter, Stefan Kreissig | 2009-08-25 |
| 7579854 | Probe station and method for measurements of semiconductor devices under defined atmosphere | Jorg Kiesewetter, Stefan Kreissig, Claus Dietrich | 2009-08-25 |
| 7573283 | Method for measurement of a device under test | Axel Schmidt, Frank Fehrmann, Ulf Hackius, Steffen Laube, Jorg Kiesewetter | 2009-08-11 |
| 7560942 | Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus | Hans-Jurgen Fleischer, Axel Schmidt, Axel Becker | 2009-07-14 |
| 7332923 | Test probe for high-frequency measurement | Steffen Schott | 2008-02-19 |
| 7057408 | Method and prober for contacting a contact area with a contact tip | Stefan Schneidewind, Claus Dietrich, Jorg Kiesewetter, Stefan Kreissig, Frank Fehrmann +1 more | 2006-06-06 |