Issued Patents All Time
Showing 26–50 of 73 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9368713 | Piezoelectric film-attached substrate, piezoelectric film element and method of manufacturing the same | Kenji Shibata, Kazufumi Suenaga, Akira Nomoto, Fumimasa Horikiri | 2016-06-14 |
| 9299911 | Piezoelectric thin-film multilayer body | Kazufumi Suenaga, Kenji Shibata, Fumimasa Horikiri, Masaki Noguchi | 2016-03-29 |
| 9293688 | Piezoelectric element and piezoelectric device | Kazufumi Suenaga, Kenji Shibata, Akira Nomoto, Fumimasa Horikiri | 2016-03-22 |
| 9231185 | Method for manufacturing a piezoelectric film wafer, piezoelectric film element, and piezoelectric film device | Fumimasa Horikiri, Kenji Shibata, Kazufumi Suenaga, Akira Nomoto | 2016-01-05 |
| 9166142 | Manufacturing method of piezoelectric film element, piezoelectric film element and piezoelectric device | Fumimasa Horikiri, Kenji Shibata, Kazufumi Suenaga, Akira Nomoto | 2015-10-20 |
| 8896187 | Piezoelectric film and method for manufacturing the same, piezoelectric film element and method for manufacturing the same, and piezoelectric film device | Kazufumi Suenaga, Kenji Shibata, Akira Nomoto, Fumimasa Horikiri | 2014-11-25 |
| 8860286 | Piezoelectric thin film element, and piezoelectric thin film device | Kazufumi Suenaga, Kenji Shibata, Akira Nomoto | 2014-10-14 |
| 8608373 | Softening point measuring apparatus and thermal conductivity measuring apparatus | Kazunori Ando, Masayuki Iwasa, Masatsugu Shigeno, Hiroumi Momota | 2013-12-17 |
| 8581477 | Piezoelectric film element using (Na,K,Li)NbO3 | Kazufumi Suenaga, Kenji Shibata, Akira Nomoto | 2013-11-12 |
| 8519602 | Piezoelectric thin film element and piezoelectric thin film device using a piezoelectric thin film of alkali-niobium oxide series | Kenji Shibata, Kazufumi Suenaga, Akira Nomoto | 2013-08-27 |
| 8450911 | Piezoelectric thin film having a high piezoelectric constant and a low leak current | Kenji Shibata, Kazufumi Suenaga, Akira Nomoto | 2013-05-28 |
| 8446074 | Piezoelectric thin-film element and piezoelectric thin-film device | Kenji Shibata, Kazufumi Suenaga, Akira Nomoto, Fumimasa Horikiri | 2013-05-21 |
| 8334794 | Input device and keyboard device having illumination function | Hideaki Nagakubo, Takenobu Kimura, Koichi Yamamoto, Katsuyuki Katayama, Naomi Sato +6 more | 2012-12-18 |
| 8214915 | Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever | Masatsugu Shigeno, Masato Iyoki, Naoya Watanabe | 2012-07-03 |
| 8120059 | Nitride semiconductor substrate and method of fabricating the same | Takehiro Yoshida | 2012-02-21 |
| 7997124 | Scanning probe microscope | Yoshiteru Shikakura | 2011-08-16 |
| 7973942 | Optical displacement detection mechanism and surface information measurement device using the same | Masato Iyoki, Hiroyoshi Yamamoto, Masatsugu Shigeno | 2011-07-05 |
| 7787133 | Optical displacement-detecting mechanism and probe microscope using the same | Masato Iyoki, Hiroyoshi Yamamoto | 2010-08-31 |
| 7740703 | Semiconductor film formation device | Mitsuru Hasegawa, Akihiro Miyauchi, Meguro Takeshi | 2010-06-22 |
| 7571639 | Method of correcting opaque defect of photomask using atomic force microscope fine processing device | Toshio Doi, Osamu Takaoka, Atsushi Uemoto | 2009-08-11 |
| 7442925 | Working method using scanning probe | Masatoshi Yasutake, Takuya Nakaue, Osamu Takaoka, Atsushi Uemoto, Naoya Watanabe +1 more | 2008-10-28 |
| 7414612 | Analog input device | Hirofumi Niitsuma, Junichi Inamuara, Isao Sato | 2008-08-19 |
| 7404313 | Scanning probe microscope | — | 2008-07-29 |
| 7373806 | Scanning probe microscope and scanning method | Itaru Kitajima, Shigeru Wakiyama, Masatoshi Yasutake, Akira Inoue | 2008-05-20 |
| 7288762 | Fine-adjustment mechanism for scanning probe microscopy | Masato Iyoki, Akihiko Hidaka | 2007-10-30 |