JT

Junichi Tanaka

SO Sony: 85 patents #164 of 25,231Top 1%
HH Hitachi High-Technologies: 22 patents #91 of 1,917Top 5%
Pioneer: 16 patents #66 of 1,730Top 4%
FU Fujifilm: 15 patents #581 of 4,519Top 15%
OM Omron: 12 patents #186 of 3,089Top 7%
VM Velos Media: 9 patents #12 of 51Top 25%
Sharp Kabushiki Kaisha: 9 patents #1,853 of 10,731Top 20%
Canon: 8 patents #7,260 of 19,416Top 40%
NE Nec: 7 patents #2,006 of 14,502Top 15%
DA Daihen: 6 patents #35 of 305Top 15%
LU Lumiotec: 6 patents #1 of 12Top 9%
Mazda Motor: 5 patents #800 of 4,755Top 20%
UN Unknown: 3 patents #7,366 of 83,584Top 9%
KC Kuraray Co.: 3 patents #492 of 1,827Top 30%
KK Kirin Beer Kabushiki Kaisha: 2 patents #76 of 379Top 25%
KO Komori: 2 patents #78 of 219Top 40%
NS Nippon Sanso: 2 patents #72 of 243Top 30%
KO Komatsu: 2 patents #831 of 2,087Top 40%
HO Hoya: 2 patents #523 of 1,290Top 45%
FC Fukuda Metal Foil & Powder Co.: 2 patents #26 of 95Top 30%
FU Fujinon: 2 patents #115 of 339Top 35%
Mitsubishi Electric: 1 patents #15,491 of 25,717Top 65%
UH University Of Hyogo: 1 patents #10 of 36Top 30%
NC Nippon Carbon Co.: 1 patents #26 of 58Top 45%
NS Nippon Steel: 1 patents #2,111 of 4,423Top 50%
HC Hitachi Power Solutions Co.: 1 patents #33 of 69Top 50%
TO Toyota: 1 patents #15,335 of 26,838Top 60%
DE Denso: 1 patents #6,940 of 11,792Top 60%
RE Renesas Electronics: 1 patents #2,739 of 4,529Top 65%
Overall (All Time): #1,904 of 4,157,543Top 1%
254
Patents All Time

Issued Patents All Time

Showing 176–200 of 254 patents

Patent #TitleCo-InventorsDate
7601240 Disturbance-free, recipe-controlled plasma processing system and method Akira Kagoshima, Hideyuki Yamamoto, Shoji Ikuhara, Toshio Masuda, Hiroyuki Kitsunai +2 more 2009-10-13
7583376 Method and device for examination of nonuniformity defects of patterns Noboru Yamaguchi 2009-09-01
D588097 Amplifier 2009-03-10
7473332 Method for processing semiconductor Hiroyuki Kitsunai, Hideyuki Yamamoto, Akira Kagoshima, Daisuke Shiraishi 2009-01-06
D581904 Loudspeaker 2008-12-02
7460747 Waveguide and optical cable module Hirokatsu Nakayama, Naru Yasuda, Hayami Hosokawa 2008-12-02
D580407 Amplifier 2008-11-11
D578519 Loudspeaker frame Koji Nakane, Hiroki Akaishi 2008-10-14
D573980 Loudspeaker Koji Nakane, Hiroki Akaishi 2008-07-29
7396771 Plasma etching apparatus and plasma etching method Go Miya, Seiichiro Kanno, Naoshi Itabashi, Motohiko Yoshigai, Masahito Mori +2 more 2008-07-08
7376479 Process monitoring device for sample processing apparatus and control method of sample processing apparatus Hiroyuki Kitsunai, Hideyuki Yamamoto, Shoji Ikuhara, Kazue Takahashi 2008-05-20
D567231 Loudspeaker frame Koji Nakane, Hiroki Akaishi 2008-04-22
D567225 Loudspeaker Koji Nakane, Hiroki Akaishi 2008-04-22
7343217 System for monitoring and controlling a semiconductor manufacturing apparatus using prediction model equation Hiroyuki Kitsunai, Akira Kagoshima, Daisuke Shiraishi, Hideyuki Yamamoto, Shoji Ikuhara +1 more 2008-03-11
7304744 Apparatus and method for measuring the thickness of a thin film via the intensity of reflected light Masatsugu Hatanaka, Toru Tanigawa, Yasunobu Tagusa 2007-12-04
D555117 Television receiver Hironori Ohishi 2007-11-13
7158848 Process monitoring device for sample processing apparatus and control method of sample processing apparatus Hiroyuki Kitsunai, Hideyuki Yamamoto, Shoji Ikuhara, Kazue Takahashi 2007-01-02
7147748 Plasma processing method Go Miya, Hiroyuki Kitsunai, Toshio Masuda, Hideyuki Yamamoto 2006-12-12
7147747 Plasma processing apparatus and plasma processing method Go Miya, Hiroyuki Kitsunai, Toshio Masuda, Hideyuki Yamamoto 2006-12-12
7122096 Method and apparatus for processing semiconductor Hiroyuki Kitsunai, Hideyuki Yamamoto, Akira Kagoshima, Daisuke Shiraishi 2006-10-17
7107115 Method for controlling semiconductor processing apparatus Hideyuki Yamamoto, Shoji Ikuhara, Akira Kagoshima 2006-09-12
7062347 Maintenance method and system for plasma processing apparatus Hideyuki Yamamoto, Toshio Masuda, Shoji Ikuhara, Akira Kagoshima 2006-06-13
7058467 Process monitoring device for sample processing apparatus and control method of sample processing apparatus Hiroyuki Kitsunai, Hideyuki Yamamoto, Shoji Ikuhara, Kazue Takahashi 2006-06-06
7058470 Method of monitoring and/or controlling a semiconductor manufacturing apparatus and a system therefor Hiroyuki Kitsunai, Akira Kagoshima, Daisuke Shiraishi, Hideyuki Yamamoto, Shoji Ikuhara +1 more 2006-06-06
7010374 Method for controlling semiconductor processing apparatus Hideyuki Yamamoto, Shoji Ikuhara, Akira Kagoshima 2006-03-07