Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9708726 | Silicon wafer heat treatment method | Wei Qu | 2017-07-18 |
| 9606030 | Method for detecting crystal defects | Wei Qu, Yuuki Ooi | 2017-03-28 |
| 8916953 | Method for manufacturing silicon single crystal wafer and annealed wafer | Wei Qu, Yuuki Ooi, Shu Sugisawa | 2014-12-23 |
| 8900971 | Bonded substrate and manufacturing method thereof | Tsuyoshi Ohtsuki, Wei Qu, Yuuki Ooi, Kiyoshi Mitani | 2014-12-02 |
| 8877609 | Method for manufacturing bonded substrate having an insulator layer in part of bonded substrate | Tsuyoshi Ohtsuki, Wei Qu, Yuuki Ooi, Kiyoshi Mitani | 2014-11-04 |
| 8551246 | Method for evaluating oxide dielectric breakdown voltage of a silicon single crystal wafer | Tsuyoshi Ohtsuki, Takatoshi Nagoya, Kiyoshi Mitani | 2013-10-08 |
| 7713851 | Method of manufacturing silicon epitaxial wafer | Fumitaka Kume, Tomosuke Yoshida, Ken Aihara, Ryoji Hoshi, Satoshi Tobe +1 more | 2010-05-11 |