Issued Patents All Time
Showing 25 most recent of 31 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12405390 | Control apparatus, system, method, and program | Takuto Sakumura, Yasukazu Nakaye, Kazuyuki Matsushita | 2025-09-02 |
| 12287301 | Correction amount specifying apparatus, method, program, and jig | Takuya KIKUCHI, Ryuji Matsuo | 2025-04-29 |
| 12174131 | Quantitative analysis apparatus, method and program and manufacturing control system | Takahiro Kuzumaki, Miki Kasari, Akihiro Himeda, Atsushi Ohbuchi, Takayuki Konya | 2024-12-24 |
| 12175173 | Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis program | Tomoyuki Iwata, Kazuhiko Omote, Kazuki ITO | 2024-12-24 |
| 11942231 | Airtight box for measurement, airtight apparatus, measurement system and measurement apparatus | Koichiro Ito, Takeshi Ozawa | 2024-03-26 |
| 11215571 | X-ray analysis apparatus | Takeshi Osakabe, Kazuki Omoto | 2022-01-04 |
| 10900913 | X-ray diffraction apparatus | Takeshi Osakabe | 2021-01-26 |
| 10854348 | X-ray generator and x-ray analysis device | Kazuhiko Omote, Takeshi Osakabe, Licai Jiang, Boris Verman | 2020-12-01 |
| 10556297 | Welded section examining device | Masahiko Kamiyama, Atsuhiro Hatanaka, Yoshiyuki Izumi | 2020-02-11 |
| 10436723 | X-ray diffractometer with multilayer reflection-type monochromator | Takeshi Osakabe, Kazuhiko Omote, Licai Jiang, Boris Verman, Yuriy Platonov | 2019-10-08 |
| 9618461 | X-ray analysis apparatus | Takao Ohara, Kenji Wakasaya, Kunio Nishi | 2017-04-11 |
| 9490038 | X-ray optical component device and X-ray analyzer | Kenji Wakasaya | 2016-11-08 |
| 9336917 | X-ray apparatus, method of using the same and X-ray irradiation method | Ryuji Matsuo, Licai Jiang, Boris Verman, Kazuhiko Omote | 2016-05-10 |
| 9166360 | Laser light source apparatus | Yoshihiro Horikawa, Takayuki Kozakura, Toru Nishikubo, Takanori Samejima, Kazuhiro Yoshida | 2015-10-20 |
| 9074992 | X-ray diffraction apparatus and X-ray diffraction measurement method | Ryuji Matsuo, Katsuhiko Inaba | 2015-07-07 |
| 8991641 | Pressure vessel and method of manufacturing the same | Nozomu Kawasetsu, Kentaro Shindo, Mitsuru Kondo, Akira Fukushima, Masayasu Ishibashi +4 more | 2015-03-31 |
| 8319976 | Three-dimensional shape measuring system and three-dimensional shape measuring method | Yasuhiro Kawai, Kazuhiko Yamaashi, Kensaku Kaneyasu | 2012-11-27 |
| 8024067 | Working station | Yoshiharu Sakai, Kazuyoshi Fukuzawa, Yoshito Ohtake, Hiroki Baba | 2011-09-20 |
| 7896392 | Airbag deployment controller and passenger protection device including the same | Tohru Oowada, Mineyuki Ooishi, Ryuichi Asada, Toshinori Yagi | 2011-03-01 |
| 7860217 | X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the same | Ryuji Matsuo, Go Fujinawa, Akira Echizenya | 2010-12-28 |
| 7684543 | X-ray beam conditioning device and X-ray analysis apparatus | Ryuji Matsuo, Katsuhiko Inaba, Makoto Aoyagi | 2010-03-23 |
| 7558656 | Vehicle data recording device | — | 2009-07-07 |
| 7337098 | Diffraction condition simulation device, diffraction measurement system, and crystal analysis system | Ryouichi Yokoyama, Kamihisa Endo, Jimpei Harada | 2008-02-26 |
| 7266433 | Data recording apparatus for vehicle | — | 2007-09-04 |
| 7120227 | Method of displaying dynamically scattering vector of X-ray diffraction | Susumu Yamaguchi, Kohji Kakefuda | 2006-10-10 |