Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12409796 | Electrical connection box including lid with ribs stabilizing the double-walled construction, and at least one rib sealing electronics compartment | Hiroki Tashiro, Takuma Kaneko | 2025-09-09 |
| 12399141 | Damage measurement method, apparatus and program, and x-ray diffraction apparatus | Kazuhiko Omote, Daisuke Kobayashi | 2025-08-26 |
| 11654844 | Electric connection box and wire harness | Hiroki Tashiro, Atsushi Sumida, Junya Masuda | 2023-05-23 |
| 11615935 | Electrical connection box and wire harness | Hiroki Tashiro, Takuma Kaneko | 2023-03-28 |
| 11529915 | Electrical connection box and wire harness | Hiroki Tashiro, Takuma Kaneko | 2022-12-20 |
| 11464122 | Lock structure, electrical connection box, and wire harness | Hiroki Tashiro, Masahiro Wada | 2022-10-04 |
| 11462896 | Electrical connection box | Hiroki Tashiro, Takuma Kaneko | 2022-10-04 |
| 11427142 | Electrical connection box with bonder cap and shallow/deep bottom parts, and wire harness including same | Hiroki Tashiro, Atsushi Sumida, Junya Masuda | 2022-08-30 |
| 11394187 | Electric connection box and wire harness | Hiroki Tashiro, Atsushi Sumida, Junya Masuda | 2022-07-19 |
| 10850686 | Electrical connection box and wire harness | Hiroki Tashiro, Masahiro Wada | 2020-12-01 |
| 7337098 | Diffraction condition simulation device, diffraction measurement system, and crystal analysis system | Kamihisa Endo, Tetsuya Ozawa, Jimpei Harada | 2008-02-26 |
| 7003074 | Stress measurement method using X-ray diffraction | Kamihisa Endo | 2006-02-21 |
| 6937694 | Pole measuring method | Kazuhiko Omote, Kamihisa Endo, Ryuji Matsuo | 2005-08-30 |
| 6874369 | Stress measurement method using X-ray diffraction | Kamihisa Endo | 2005-04-05 |