Issued Patents All Time
Showing 25 most recent of 51 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12399141 | Damage measurement method, apparatus and program, and x-ray diffraction apparatus | Ryouichi Yokoyama, Daisuke Kobayashi | 2025-08-26 |
| 12222303 | Transmissive small-angle scattering device | Naoki Matsushima, Kiyoshi Ogata, Sei Yoshihara, Yoshiyasu Ito, Hiroshi Motono +3 more | 2025-02-11 |
| 12175173 | Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis program | Tomoyuki Iwata, Kazuki ITO, Tetsuya Ozawa | 2024-12-24 |
| 12019036 | Transmissive small-angle scattering device | Naoki Matsushima, Kiyoshi Ogata, Sei Yoshihara, Yoshiyasu Ito, Hiroshi Motono +3 more | 2024-06-25 |
| 11885753 | Imaging type X-ray microscope | Raita HIROSE, Shuichi Kato, Yuriy Platonov | 2024-01-30 |
| 11867646 | Total reflection x-ray fluorescence spectrometer | Makoto Kambe, Toshifumi Higuchi, Tsutomu Tada, Hajime Fujimura, Masahiro Nonoguchi +3 more | 2024-01-09 |
| 11754515 | Transmissive small-angle scattering device | Naoki Matsushima, Kiyoshi Ogata, Sei Yoshihara, Yoshiyasu Ito, Hiroshi Motono +3 more | 2023-09-12 |
| 11733185 | Fluorescent X-ray analysis apparatus comprising a plurality of X-ray detectors and an X-ray irradiation unit including a multi-wavelength mirror | Kiyoshi Ogata, Sei Yoshihara, Shuichi Kato, Hiroshi Motono, Naoki Matsushima | 2023-08-22 |
| 11408837 | Analysis method for fine structure, and apparatus and program thereof | Yoshiyasu Ito | 2022-08-09 |
| 11131637 | Analysis method for fine structure, apparatus, and program | Yoshiyasu Ito | 2021-09-28 |
| 11079345 | X-ray inspection device | Naoki Matsushima, Kiyoshi Ogata, Sei Yoshihara, Yoshiyasu Ito, Hiroshi Motono +6 more | 2021-08-03 |
| 10983073 | Hybrid inspection system | Kiyoshi Ogata, Yoshiyasu Ito | 2021-04-20 |
| 10964439 | Soller slit, X-ray diffraction apparatus, and method | Ladislav Pina, Adolf Inneman, Shintaro Kobayashi | 2021-03-30 |
| 10876978 | X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curve | Kiyoshi Ogata, Sei Yoshihara, Yoshiyasu Ito, Hiroshi Motono, Hideaki Takahashi +9 more | 2020-12-29 |
| 10854348 | X-ray generator and x-ray analysis device | Takeshi Osakabe, Tetsuya Ozawa, Licai Jiang, Boris Verman | 2020-12-01 |
| 10598616 | X-ray reflectometer | Satoshi Murakami, Shinya Kikuta, Akihiro Ikeshita | 2020-03-24 |
| 10514345 | X-ray thin film inspection device | Kiyoshi Ogata, Yoshiyasu Ito, Hiroshi Motono, Muneo Yoshida, Hideaki Takahashi | 2019-12-24 |
| 10473598 | X-ray thin film inspection device | Kiyoshi Ogata, Sei Yoshihara, Takao Kinefuchi, Shiro Umegaki, Shigematsu Asano +8 more | 2019-11-12 |
| 10436723 | X-ray diffractometer with multilayer reflection-type monochromator | Takeshi Osakabe, Tetsuya Ozawa, Licai Jiang, Boris Verman, Yuriy Platonov | 2019-10-08 |
| 10429325 | X-ray small angle optical system | Kazuki ITO, Licai Jiang | 2019-10-01 |
| 10302579 | Grazing incidence x-ray fluorescence spectrometer and grazing incidence x-ray fluorescence analyzing method | Takashi Yamada | 2019-05-28 |
| 10145808 | Beam generation unit and X-ray small-angle scattering apparatus | Kazuki ITO | 2018-12-04 |
| 9658174 | X-ray topography apparatus | Keiichi Morikawa, Yoshinori Ueji, Masahiro Tsuchiya, Takeshi Fujimura, Atsunori Kiku | 2017-05-23 |
| 9336917 | X-ray apparatus, method of using the same and X-ray irradiation method | Tetsuya Ozawa, Ryuji Matsuo, Licai Jiang, Boris Verman | 2016-05-10 |
| 9335282 | X-ray topography apparatus | Yoshinori Ueji, Ryuji Matsuo, Tetsuo Kikuchi | 2016-05-10 |