Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10598616 | X-ray reflectometer | Satoshi Murakami, Kazuhiko Omote, Shinya Kikuta | 2020-03-24 |
| 9146204 | X-ray analyzing apparatus and method | Tomoyuki Fukuda, Kosuke Shimizu | 2015-09-29 |
| 6937691 | X-ray fluorescence spectrometric system and a program for use therein | Motoyuki Yamagami | 2005-08-30 |
| 6735276 | Sample preprocessing system for a fluorescent X-ray analysis and X-ray fluorescence spectrometric system using the same | Motoyuki Yamagami | 2004-05-11 |