Sei Yoshihara — 7 Patents at Rigaku

Sei Yoshihara has been granted 7 US patents while listed as an inventor at Rigaku. The first was granted in 2019 and the most recent in February 2025. Sei Yoshihara ranks #680,018 of 4,157,543 US inventors in our database (top 16.4%). Patent records list Sei Yoshihara in Tokyo, JP.

Issued Patents All Time

Showing 1–7 of 7 patents

Patent #	Title	Co-Inventors	Date
12222303	Transmissive small-angle scattering device	Naoki Matsushima, Kiyoshi Ogata, Yoshiyasu Ito, Kazuhiko Omote, Hiroshi Motono +3 more	2025-02-11
12019036	Transmissive small-angle scattering device	Naoki Matsushima, Kiyoshi Ogata, Yoshiyasu Ito, Kazuhiko Omote, Hiroshi Motono +3 more	2024-06-25
11754515	Transmissive small-angle scattering device	Naoki Matsushima, Kiyoshi Ogata, Yoshiyasu Ito, Kazuhiko Omote, Hiroshi Motono +3 more	2023-09-12
11733185	Fluorescent X-ray analysis apparatus comprising a plurality of X-ray detectors and an X-ray irradiation unit including a multi-wavelength mirror	Kiyoshi Ogata, Shuichi Kato, Kazuhiko Omote, Hiroshi Motono, Naoki Matsushima	2023-08-22
11079345	X-ray inspection device	Naoki Matsushima, Kiyoshi Ogata, Kazuhiko Omote, Yoshiyasu Ito, Hiroshi Motono +6 more	2021-08-03
10876978	X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curve	Kiyoshi Ogata, Kazuhiko Omote, Yoshiyasu Ito, Hiroshi Motono, Hideaki Takahashi +9 more	2020-12-29
10473598	X-ray thin film inspection device	Kiyoshi Ogata, Takao Kinefuchi, Shiro Umegaki, Shigematsu Asano, Katsutaka Horada +8 more	2019-11-12

Sei Yoshihara — 7 Patents

Issued Patents All Time

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