Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876978 | X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curve | Kiyoshi Ogata, Kazuhiko Omote, Sei Yoshihara, Yoshiyasu Ito, Hiroshi Motono +9 more | 2020-12-29 |
| 10473598 | X-ray thin film inspection device | Kiyoshi Ogata, Sei Yoshihara, Shiro Umegaki, Shigematsu Asano, Katsutaka Horada +8 more | 2019-11-12 |
| 7258485 | X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned wafer | Asao Nakano, Hiroshi Motono, Atsunori Kiku | 2007-08-21 |