Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9658174 | X-ray topography apparatus | Kazuhiko Omote, Keiichi Morikawa, Yoshinori Ueji, Masahiro Tsuchiya, Takeshi Fujimura | 2017-05-23 |
| 7258485 | X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned wafer | Asao Nakano, Takao Kinefuchi, Hiroshi Motono | 2007-08-21 |