Fluorescent X-ray analysis apparatus comprising a plurality of X-ray detectors and an X-ray irradiation unit including a multi-wavelength mirror

Assignee

• Rigaku

Inventors

• Kiyoshi Ogata (78 patents)
• Sei Yoshihara (7 patents)
• Shuichi Kato (63 patents)
• Kazuhiko Omote (51 patents)
• Hiroshi Motono (12 patents)
• Naoki Matsushima (39 patents)

View full patent text on Google Patents →