Issued Patents All Time
Showing 26–50 of 51 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9250199 | X-ray imaging apparatus, and X-ray imaging method | Yoshihiko Takeda | 2016-02-02 |
| 9159524 | X-ray generating apparatus | Martin Horvarth, Jiri Marsik, Ladislav Pina, Vaclav Jelinek, Naohisa Osaka +3 more | 2015-10-13 |
| 9086367 | X-ray intensity correction method and X-ray diffractometer | Toru Mitsunaga, Katsuhiko Inaba | 2015-07-21 |
| 9020101 | Target for X-ray generator, method of manufacturing the same and X-ray generator | Kazuaki Shimizu, Naohisa Osaka | 2015-04-28 |
| 8908830 | Surface microstructure measurement method, surface microstructure measurement data analysis method and X-ray scattering measurement device | Yoshiyasu Ito | 2014-12-09 |
| 8767918 | X-ray scattering measurement device and X-ray scattering measurement method | Boris Verman, Licai Jiang | 2014-07-01 |
| 8712013 | Motion control system and X-ray measurement apparatus | Tetsuo Kani, Tomoyasu Ueda, Kiyoshi Ogata, Kenji Wakasaya | 2014-04-29 |
| 8699663 | X-ray image photographing method and X-ray image photographing apparatus | Makoto Kambe, Yoshihiro Takeda | 2014-04-15 |
| 8085900 | Method for X-ray wavelength measurement and X-ray wavelength measurement apparatus | — | 2011-12-27 |
| 7342997 | Method for measuring dead time of X-ray detector | Tomoyasu Ueda, Yoshiyasu Ito | 2008-03-11 |
| 7257192 | Method and apparatus for X-ray reflectance measurement | — | 2007-08-14 |
| 7248669 | Method for analyzing membrane structure and apparatus therefor | Yoshiyasu Ito | 2007-07-24 |
| 7221734 | Method for X-ray reflectance measurement | — | 2007-05-22 |
| 7130373 | Method and apparatus for film thickness measurement | Akihiro Himeda | 2006-10-31 |
| 7116755 | Non-uniform density sample analyzing method, device and system | — | 2006-10-03 |
| 7098459 | Method of performing analysis using propagation rays and apparatus for performing the same | Akito Sasaki, Yoshiyasu Ito | 2006-08-29 |
| 7039161 | Method for analyzing film structure and apparatus therefor | Yoshiyasu Ito | 2006-05-02 |
| 7035373 | X-ray diffraction apparatus | — | 2006-04-25 |
| 6970532 | Method and apparatus for measuring thin film, and thin film deposition system | Seiichi Hayashi, Jimpei Harada, Tetsuo Kikuchi, Katsuhiko Inaba | 2005-11-29 |
| 6937694 | Pole measuring method | Ryouichi Yokoyama, Kamihisa Endo, Ryuji Matsuo | 2005-08-30 |
| 6920200 | Density-nonuniform multilayer film analyzing method, and apparatus and system thereof | Yoshiyasu Ito | 2005-07-19 |
| 6873681 | Method of estimating preferred orientation of polycrystalline material | Hideo Toraya | 2005-03-29 |
| 6459763 | Combinatorial X-ray diffractor | Hideomi Koinuma, Masashi Kawasaki, Tetsuo Kikuchi | 2002-10-01 |
| 6385281 | Fluorescent x-ray analyzing method and apprartus | Tetsuya Ozawa, Jimpei Harada | 2002-05-07 |
| 6307917 | Soller slit and X-ray apparatus | Katsuhiko Shimizu, Go Fujinawa | 2001-10-23 |