Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12405235 | Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium | — | 2025-09-02 |
| 12287300 | Device and method for analyzing diffraction pattern of mixture, and information storage medium | — | 2025-04-29 |
| 12031927 | Method and device for analyzing diffraction pattern of mixture, and information storage medium | — | 2024-07-09 |
| 11852597 | Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium | — | 2023-12-26 |
| 11841334 | Quantitative phase analysis device, quantitative phase analysis method, and non-transitory computer-readable storage medium storing quantitative phase analysis program | Norihiro Muroyama | 2023-12-12 |
| 11402341 | Quantitative phase analysis device for analyzing non-crystalline phases, quantitative phase analysis method for analyzing Non-Crystalline phases, and non-transitory computer-readable storage medium storing quantitative phase analysis program for analyzing Non-Crystalline Phases | Norihiro Muroyama | 2022-08-02 |
| 10962489 | Quantitative phase analysis device, quantitative phase analysis method, and quantitative phase analysis program | Akihiro Himeda | 2021-03-30 |
| 9417195 | Method and its apparatus for x-ray diffraction | Shigeru Munekawa | 2016-08-16 |
| 9146203 | X-ray stress measuring apparatus | Shigeru Munekawa | 2015-09-29 |
| 8340248 | X-ray diffraction method and X-ray diffraction apparatus | Hisashi Konaka | 2012-12-25 |
| 7801272 | X-ray diffraction apparatus and X-ray diffraction method | — | 2010-09-21 |
| 6873681 | Method of estimating preferred orientation of polycrystalline material | Kazuhiko Omote | 2005-03-29 |