HT

Hideo Toraya

RI Rigaku: 12 patents #6 of 239Top 3%
Overall (All Time): #396,479 of 4,157,543Top 10%
12
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12405235 Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium 2025-09-02
12287300 Device and method for analyzing diffraction pattern of mixture, and information storage medium 2025-04-29
12031927 Method and device for analyzing diffraction pattern of mixture, and information storage medium 2024-07-09
11852597 Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium 2023-12-26
11841334 Quantitative phase analysis device, quantitative phase analysis method, and non-transitory computer-readable storage medium storing quantitative phase analysis program Norihiro Muroyama 2023-12-12
11402341 Quantitative phase analysis device for analyzing non-crystalline phases, quantitative phase analysis method for analyzing Non-Crystalline phases, and non-transitory computer-readable storage medium storing quantitative phase analysis program for analyzing Non-Crystalline Phases Norihiro Muroyama 2022-08-02
10962489 Quantitative phase analysis device, quantitative phase analysis method, and quantitative phase analysis program Akihiro Himeda 2021-03-30
9417195 Method and its apparatus for x-ray diffraction Shigeru Munekawa 2016-08-16
9146203 X-ray stress measuring apparatus Shigeru Munekawa 2015-09-29
8340248 X-ray diffraction method and X-ray diffraction apparatus Hisashi Konaka 2012-12-25
7801272 X-ray diffraction apparatus and X-ray diffraction method 2010-09-21
6873681 Method of estimating preferred orientation of polycrystalline material Kazuhiko Omote 2005-03-29