Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Hideo Toraya — 12 Patents

RIRigaku: 12 patents #6 of 239Top 3%
Akishima, JP: #49 of 519 inventorsTop 10%
Overall (All Time): #396,045 of 4,157,543Top 10%
12 Patents All Time
Hideo Toraya has been granted 12 US patents while listed as an inventor at Rigaku. The first was granted in 2005 and the most recent in September 2025. Hideo Toraya ranks #396,045 of 4,157,543 US inventors in our database (top 9.5%). Patent records list Hideo Toraya in Akishima, JP.

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
12405235 Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium 2025-09-02
12287300 Device and method for analyzing diffraction pattern of mixture, and information storage medium 2025-04-29
12031927 Method and device for analyzing diffraction pattern of mixture, and information storage medium 2024-07-09
11852597 Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium 2023-12-26
11841334 Quantitative phase analysis device, quantitative phase analysis method, and non-transitory computer-readable storage medium storing quantitative phase analysis program Norihiro Muroyama 2023-12-12
11402341 Quantitative phase analysis device for analyzing non-crystalline phases, quantitative phase analysis method for analyzing Non-Crystalline phases, and non-transitory computer-readable storage medium storing quantitative phase analysis program for analyzing Non-Crystalline Phases Norihiro Muroyama 2022-08-02
10962489 Quantitative phase analysis device, quantitative phase analysis method, and quantitative phase analysis program Akihiro Himeda 2021-03-30
9417195 Method and its apparatus for x-ray diffraction Shigeru Munekawa 2016-08-16
9146203 X-ray stress measuring apparatus Shigeru Munekawa 2015-09-29
8340248 X-ray diffraction method and X-ray diffraction apparatus Hisashi Konaka 2012-12-25
7801272 X-ray diffraction apparatus and X-ray diffraction method 2010-09-21
6873681 Method of estimating preferred orientation of polycrystalline material Kazuhiko Omote 2005-03-29