Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12313573 | X-ray diffraction apparatus and measurement method | — | 2025-05-27 |
| 11788974 | Control apparatus, system, method, and program | Shintaro Kobayashi, Katsuhiko Inaba | 2023-10-17 |
| 10876979 | Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction | Akihiro Himeda, Toru Mitsunaga, Keigo Nagao | 2020-12-29 |
| 10296725 | Structure refining apparatus, method and program | — | 2019-05-21 |
| 8340248 | X-ray diffraction method and X-ray diffraction apparatus | Hideo Toraya | 2012-12-25 |