Akihiro Himeda — 9 Patents at Rigaku

Akihiro Himeda has been granted 9 US patents while listed as an inventor at Rigaku. The first was granted in 2006 and the most recent in December 2024. Akihiro Himeda ranks #535,341 of 4,157,543 US inventors in our database (top 12.9%). Patent records list Akihiro Himeda in Akishima, JP.

Issued Patents All Time

Showing 1–9 of 9 patents

Patent #	Title	Co-Inventors	Date
12174131	Quantitative analysis apparatus, method and program and manufacturing control system	Takahiro Kuzumaki, Tetsuya Ozawa, Miki Kasari, Atsushi Ohbuchi, Takayuki Konya	2024-12-24
11300529	Analysis apparatus, analysis method and analysis program	Atsushi Ohbuchi, Takayuki Konya, Go Fujinawa	2022-04-12
10962489	Quantitative phase analysis device, quantitative phase analysis method, and quantitative phase analysis program	Hideo Toraya	2021-03-30
10876979	Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction	Hisashi Konaka, Toru Mitsunaga, Keigo Nagao	2020-12-29
10801976	Method for displaying measurement results from x-ray diffraction measurement	Akito Sasaki, Yukiko Ikeda, Keigo Nagao	2020-10-13
10393679	Operation guide system for X-ray analysis,operation guide method therefor, and operation guide program therefor	—	2019-08-27
10161888	Crystalline phase identification method, crystalline phase identification device, and X-ray diffraction measurement system	Yukiko Ikeda, Keigo Nagao	2018-12-25
8971492	Analysis method for X-ray diffraction measurement data	Akito Sasaki, Keiichi Morikawa, Hiroki Yoshida	2015-03-03
7130373	Method and apparatus for film thickness measurement	Kazuhiko Omote	2006-10-31

Akihiro Himeda — 9 Patents

Issued Patents All Time

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