Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12174131 | Quantitative analysis apparatus, method and program and manufacturing control system | Takahiro Kuzumaki, Tetsuya Ozawa, Miki Kasari, Atsushi Ohbuchi, Takayuki Konya | 2024-12-24 |
| 11300529 | Analysis apparatus, analysis method and analysis program | Atsushi Ohbuchi, Takayuki Konya, Go Fujinawa | 2022-04-12 |
| 10962489 | Quantitative phase analysis device, quantitative phase analysis method, and quantitative phase analysis program | Hideo Toraya | 2021-03-30 |
| 10876979 | Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction | Hisashi Konaka, Toru Mitsunaga, Keigo Nagao | 2020-12-29 |
| 10801976 | Method for displaying measurement results from x-ray diffraction measurement | Akito Sasaki, Yukiko Ikeda, Keigo Nagao | 2020-10-13 |
| 10393679 | Operation guide system for X-ray analysis,operation guide method therefor, and operation guide program therefor | — | 2019-08-27 |
| 10161888 | Crystalline phase identification method, crystalline phase identification device, and X-ray diffraction measurement system | Yukiko Ikeda, Keigo Nagao | 2018-12-25 |
| 8971492 | Analysis method for X-ray diffraction measurement data | Akito Sasaki, Keiichi Morikawa, Hiroki Yoshida | 2015-03-03 |
| 7130373 | Method and apparatus for film thickness measurement | Kazuhiko Omote | 2006-10-31 |