Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12174131 | Quantitative analysis apparatus, method and program and manufacturing control system | Tetsuya Ozawa, Miki Kasari, Akihiro Himeda, Atsushi Ohbuchi, Takayuki Konya | 2024-12-24 |