Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9417195 | Method and its apparatus for x-ray diffraction | Hideo Toraya | 2016-08-16 |
| 9146203 | X-ray stress measuring apparatus | Hideo Toraya | 2015-09-29 |
| 4972448 | Goniometer in an x-ray diffraction device | — | 1990-11-20 |