Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7337098 | Diffraction condition simulation device, diffraction measurement system, and crystal analysis system | Ryouichi Yokoyama, Tetsuya Ozawa, Jimpei Harada | 2008-02-26 |
| 7003074 | Stress measurement method using X-ray diffraction | Ryouichi Yokoyama | 2006-02-21 |
| 6937694 | Pole measuring method | Ryouichi Yokoyama, Kazuhiko Omote, Ryuji Matsuo | 2005-08-30 |
| 6874369 | Stress measurement method using X-ray diffraction | Ryouichi Yokoyama | 2005-04-05 |