| 11885753 |
Imaging type X-ray microscope |
Kazuhiko Omote, Raita HIROSE, Shuichi Kato |
2024-01-30 |
| 11867646 |
Total reflection x-ray fluorescence spectrometer |
Makoto Kambe, Kazuhiko Omote, Toshifumi Higuchi, Tsutomu Tada, Hajime Fujimura +3 more |
2024-01-09 |
| 10436723 |
X-ray diffractometer with multilayer reflection-type monochromator |
Takeshi Osakabe, Tetsuya Ozawa, Kazuhiko Omote, Licai Jiang, Boris Verman |
2019-10-08 |
| 8249220 |
Multiconfiguration X-ray optical system |
Boris Verman, Licai Jiang |
2012-08-21 |
| 7848483 |
Magnesium silicide-based multilayer x-ray fluorescence analyzers |
Kazuaki Shimizu |
2010-12-07 |
| 6809864 |
Multi-layer structure with variable bandpass for monochromatization and spectroscopy |
Vladimir V. Martynov |
2004-10-26 |
| 6804324 |
X-ray phase contrast imaging using a fabry-perot interferometer concept |
Vladimir V. Martynov |
2004-10-12 |
| 6763086 |
Method and apparatus for detecting boron in x-ray fluorescence spectroscopy |
— |
2004-07-13 |
| 6643353 |
Protective layer for multilayers exposed to x-rays |
Boris Verman, Karsten Joensen, Srivatsan Seshardi |
2003-11-04 |
| 6510200 |
Multi-layer structure with variable bandpass for monochromatization and spectroscopy |
Vladimir V. Martynov |
2003-01-21 |