Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7860217 | X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the same | Tetsuya Ozawa, Ryuji Matsuo, Go Fujinawa | 2010-12-28 |
| 7542548 | X-ray optical system | Ryuji Matsuo, Go Fujinawa | 2009-06-02 |
| D566278 | X-ray analysis device | Aya Kuribayashi, Toru Mitsunaga, Mari Ookawa | 2008-04-08 |