Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12405390 | Control apparatus, system, method, and program | Yasukazu Nakaye, Tetsuya Ozawa, Kazuyuki Matsushita | 2025-09-02 |
| 11221423 | Processing apparatus, sysyem, X-ray measurement method, and program | Shintaro Kobayashi, Yasukazu Nakae, Yasutaka SAKUMA | 2022-01-11 |
| 11049897 | Detector | Yasukazu Nakaye, Kazuyuki Matsushita, Satoshi Mikusu | 2021-06-29 |
| 10748253 | Processing apparatus, method, and program | Yasukazu Nakaye, Kazuyuki Matsushita | 2020-08-18 |
| 10551510 | Data processing apparatus, method of obtaining characteristic of each pixel and method of data processing, and program | Yasukazu Nakaye, Yuji Tsuji, Koichi Kajiyoshi, Takeyoshi Taguchi, Kazuyuki Matsushita | 2020-02-04 |
| 10222491 | X-ray data processing apparatus and method and program for the same | Kazuyuki Matsushita, Yasukazu Nakaye | 2019-03-05 |
| 10209375 | X-ray data processing apparatus, X-ray data processing method, and X-ray data processing program | Kazuyuki Matsushita, Yasukazu Nakaye | 2019-02-19 |
| 10101476 | X-ray data processing apparatus and method and program therefor | Yasukazu Nakaye | 2018-10-16 |
| 9945961 | Radiation detector, and X-ray analysis apparatus and radiation detection method using the same | Yasukazu Nakaye, Masataka Maeyama, Kazuyuki Matsushita | 2018-04-17 |
| 9583530 | X-ray detector | Yuji Tsuji, Shinnichi Ohya, Akira Tsukiyama | 2017-02-28 |
| 9558582 | Image processing method and image processing apparatus | Yasukazu Nakaye, Koichi Kajiyoshi, Satoshi Mikusu | 2017-01-31 |
| 9341583 | Correction information generation method and correction information generation apparatus | Yasukazu Nakaye | 2016-05-17 |
| 9134431 | Radiation detector | Akira Tsukiyama, Yuji Tsuji, Pawel Grybos, Piotr Maj, Robert Szczygiel | 2015-09-15 |
| 8866094 | Radiation detector | Akira Tsukiyama, Yuji Tsuji, Pawel Grybos, Piotr Maj, Robert Szczygiel | 2014-10-21 |
| 8699665 | Wavelength-classifying type X-ray diffraction device | Kazuyuki Matsushita, Yuji Tsuji, Masataka Maeyama, Kimiko Hasegawa | 2014-04-15 |
| 8300767 | Wavelength-classifying type X-ray diffraction device | Kazuyuki Matsushita, Yuji Tsuji, Masataka Maeyama, Kimiko Hasegawa | 2012-10-30 |