YT

Yuji Tsuji

RI Rigaku: 7 patents #27 of 239Top 15%
Rohm Co.: 3 patents #810 of 2,292Top 40%
HA Hitachi Astemo: 2 patents #393 of 1,276Top 35%
HK Hamamatsu Photonics K.K.: 1 patents #936 of 1,436Top 70%
MM Murata Machinery: 1 patents #201 of 397Top 55%
OM Omron: 1 patents #1,808 of 3,089Top 60%
📍 Hamura, JP: #36 of 277 inventorsTop 15%
Overall (All Time): #312,413 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
11999563 Automated warehouse and conveyance device 2024-06-04
11437783 Surface-emitting semiconductor laser Masashi Yamamoto, Daiju Takamizu, Minoru Murayama 2022-09-06
11394257 Rotor core, rotor of rotary electrical machine, rotary electrical machine, and automotive auxiliary electrical system Kazutami Tago, Hiroshi Kanazawa, Kenji Nakayama, Takayuki CHIKAOKA 2022-07-19
11381124 Rotor core, rotor of rotary electrical machine, rotary electrical machine, and automotive auxiliary electrical system Kazutami Tago, Hiroshi Kanazawa, Kenji Nakayama, Takayuki CHIKAOKA 2022-07-05
11340350 Control circuit of light emitting and receiving device Okimoto Kondo, Tatsuro Shimizu 2022-05-24
11307060 Light-receiving module for encoder, and encoder Takayuki Suzuki 2022-04-19
10921447 Control circuit of light emitting and receiving device Okimoto Kondo, Tatsuro Shimizu 2021-02-16
10551510 Data processing apparatus, method of obtaining characteristic of each pixel and method of data processing, and program Takuto Sakumura, Yasukazu Nakaye, Koichi Kajiyoshi, Takeyoshi Taguchi, Kazuyuki Matsushita 2020-02-04
9583530 X-ray detector Takuto Sakumura, Shinnichi Ohya, Akira Tsukiyama 2017-02-28
9134431 Radiation detector Akira Tsukiyama, Takuto Sakumura, Pawel Grybos, Piotr Maj, Robert Szczygiel 2015-09-15
8866094 Radiation detector Akira Tsukiyama, Takuto Sakumura, Pawel Grybos, Piotr Maj, Robert Szczygiel 2014-10-21
8699665 Wavelength-classifying type X-ray diffraction device Kazuyuki Matsushita, Takuto Sakumura, Masataka Maeyama, Kimiko Hasegawa 2014-04-15
8300767 Wavelength-classifying type X-ray diffraction device Kazuyuki Matsushita, Takuto Sakumura, Masataka Maeyama, Kimiko Hasegawa 2012-10-30
7866208 Flow measuring device Naotsugu Ueda, Katsuyuki Yamamoto, Shuji Maeda 2011-01-11
7711091 X-ray analysis apparatus Akito Sasaki, Aya Kuribayashi, Keiichi Morikawa, Kunio Nishi, Takao Ohara +1 more 2010-05-04