Issued Patents All Time
Showing 101–115 of 115 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8881677 | Shadow mask for patterned deposition on substrates | Kurt H. Weiner | 2014-11-11 |
| 8882917 | Substrate processing including correction for deposition location | Jeremy Cheng, Ho Yin Owen Fong, Dan Wang, Zhendong Hong | 2014-11-11 |
| 8770143 | Multi-region processing system | Rick Endo, Kurt H. Weiner, James Tsung, Maosheng Zhao | 2014-07-08 |
| 8771483 | Combinatorial process system | Rick Endo, Kurt H. Weiner, James Tsung, Maosheng Zhao, Jeremy Cheng | 2014-07-08 |
| 8758581 | Combinatorial process system | Rick Endo, Kurt H. Weiner, James Tsung, Maosheng Zhao, Jeremy Cheng | 2014-06-24 |
| 8449678 | Combinatorial process system | Rick Endo, Kurt H. Weiner, James Tsung, Maosheng Zhao, Jeremy Cheng | 2013-05-28 |
| 8449681 | Composition and method for removing photoresist and bottom anti-reflective coating for a semiconductor substrate | Anh Duong | 2013-05-28 |
| 8387563 | Combinatorial process system | Rick Endo, Jeremy Cheng, James Tsung, Kurt H. Weiner, Maosheng Zhao | 2013-03-05 |
| 8349143 | Shadow masks for patterned deposition on substrates | Kurt H. Weiner | 2013-01-08 |
| 8278735 | Yttrium and titanium high-k dielectric films | Imran Hashim, Tony P. Chiang, Edward Haywood, Hanhong Chen, Nobi Fuchigami +3 more | 2012-10-02 |
| 8039052 | Multi-region processing system and heads | Rick Endo, Kurt H. Weiner, James Tsung, Maosheng Zhao | 2011-10-18 |
| 7660687 | Robust measurement of parameters | Mark A. McCord, David L. Adler | 2010-02-09 |
| 7560939 | Electrical defect detection using pre-charge and sense scanning with prescribed delays | Kurt H. Weiner, Kenichi Kanai | 2009-07-14 |
| 7280945 | Apparatus and methods for detection of systematic defects | Kurt H. Weiner, Gaurav Verma | 2007-10-09 |
| 6861666 | Apparatus and methods for determining and localization of failures in test structures using voltage contrast | Kurt H. Weiner, Gaurav Verma, Peter Nunan | 2005-03-01 |