VJ

Venkatachalam C. Jaiprakash

NA Nantero: 26 patents #9 of 73Top 15%
Infineon Technologies Ag: 11 patents #986 of 7,486Top 15%
IBM: 4 patents #21,733 of 70,183Top 35%
SA Siemens Aktiengesellschaft: 3 patents #4,667 of 22,248Top 25%
📍 Beacon, NY: #14 of 281 inventorsTop 5%
🗺 New York: #2,549 of 115,490 inventorsTop 3%
Overall (All Time): #76,874 of 4,157,543Top 2%
41
Patents All Time

Issued Patents All Time

Showing 26–41 of 41 patents

Patent #TitleCo-InventorsDate
7015092 Methods for forming vertical gate transistors providing improved isolation and alignment of vertical gate contacts Norbert Arnold 2006-03-21
6995046 Process for making byte erasable devices having elements made with nanotubes Thomas Rueckes, Claude L. Bertin 2006-02-07
6960818 Recessed shallow trench isolation structure nitride liner and method for making same Rajesh Rengarajan 2005-11-01
6944054 NRAM bit selectable two-device nanotube array Thomas Rueckes, Brent M. Segal, Bernhard Vogeli, Darren K. Brock, Claude L. Bertin 2005-09-13
6924538 Devices having vertically-disposed nanofabric articles and methods of making the same Jonathan W. Ward, Thomas Rueckes, Brent M. Segal 2005-08-02
6884676 Vertical 8F2 cell dram with active area self-aligned to bit line Norbert Arnold 2005-04-26
6849496 DRAM with vertical transistor and trench capacitor memory cells and method of fabrication Mihel Seitz, Norbert Arnold 2005-02-01
6809368 TTO nitride liner for improved collar protection and TTO reliability Rama Divakaruni, Thomas W. Dyer, Rajeev Malik, Jack A. Mandelman 2004-10-26
6768155 Circuit with buried strap including liner Rajiv Ranade 2004-07-27
6621112 DRAM with vertical transistor and trench capacitor memory cells and methods of fabrication Mihel Seitz, Norbert Arnold 2003-09-16
6605504 Method of manufacturing circuit with buried strap including a liner Rajiv Ranade 2003-08-12
6509226 Process for protecting array top oxide Jack A. Mandelman, Ramachandra Divakaruni, Rajeev Malik, Mihel Seitz 2003-01-21
6486675 In-situ method for measuring the endpoint of a resist recess etch process Ulrich Mantz 2002-11-26
6150231 Overlay measurement technique using moire patterns Karl Paul Muller, Christopher Gould 2000-11-21
6124141 Non-destructive method and device for measuring the depth of a buried interface K. Paul Muller 2000-09-26
5940717 Recessed shallow trench isolation structure nitride liner and method for making same Rajesh Rengarajan 1999-08-17