Issued Patents All Time
Showing 26–50 of 79 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8161568 | Self displacement sensing cantilever and scanning probe microscope | Masato Iyoki | 2012-04-17 |
| 8155862 | Internal combustion engine control method and internal combustion engine system | Toshiaki Nishimoto, Naohiro Yamaguchi, Masahisa Yamakawa, Takashi Youso, Kouji Shishime +3 more | 2012-04-10 |
| 7954471 | Spark ignited internal combustion engine and manufacturing the same | Toshiaki Nishimoto, Kazuhiro Nagatsu, Masatoshi Hidaka, Hiroaki Abe | 2011-06-07 |
| 7945965 | Sensor for observations in liquid environments and observation apparatus for use in liquid environments | Masatsugu Shigeno, Masato Iyoki | 2011-05-17 |
| 7823470 | Cantilever and cantilever manufacturing method | Masatsugu Shigeno, Osamu Matsuzawa, Amiko Nihei, Akira Inoue, Yoshiharu Shirakawabe +2 more | 2010-11-02 |
| 7456400 | Scanning probe microscope and scanning method | Masatsugu Shigeno, Yoshiharu Shirakawabe, Amiko Nihei, Osamu Matsuzawa, Akira Inoue | 2008-11-25 |
| 7442925 | Working method using scanning probe | Masatoshi Yasutake, Takuya Nakaue, Kazutoshi Watanabe, Osamu Takaoka, Atsushi Uemoto +1 more | 2008-10-28 |
| 7437283 | System for evaluating target board by using evaluation microcomputer in which storage of environment data are powered by evaluation tool | Yuichi Shibayama, Yoshiyuki Kubo, Norihiro Nakatsuhama | 2008-10-14 |
| 7372760 | Semiconductor device and entry into test mode without use of unnecessary terminal | Yoshiaki Nagatomi, Kenichi Kawabata, Norihiro Nakatsuhama, Tetsuya Yoshida, Tomohiro Wada +1 more | 2008-05-13 |
| 7285792 | Scratch repairing processing method and scanning probe microscope (SPM) used therefor | Osamu Takaoka | 2007-10-23 |
| 7278299 | Method of processing vertical cross-section using atomic force microscope | Osamu Takaoka, Masatoshi Yasutake, Shigeru Wakiyama | 2007-10-09 |
| 7259372 | Processing method using probe of scanning probe microscope | Osamu Takaoka, Masatoshi Yasutake, Shigeru Wakiyama | 2007-08-21 |
| 7232995 | Method of removing particle of photomask using atomic force microscope | Osamu Takaoka, Masatoshi Yasutake, Shigeru Wakiyama | 2007-06-19 |
| 7158249 | Facsimile apparatus and control method | — | 2007-01-02 |
| 7130064 | Image processing apparatus and method selectively utilizing lower than normal image recording density | Koji Okamura | 2006-10-31 |
| 7113976 | Communication apparatus and control method of the same | — | 2006-09-26 |
| 7107826 | Scanning probe device and processing method by scanning probe | Osamu Takaoka | 2006-09-19 |
| 7092305 | Semiconductor memory device | Aiko Nishino, Katsumi Dosaka | 2006-08-15 |
| 7054908 | Communication terminal, E-mail receiving method, program and storage medium | Shinya Kogure | 2006-05-30 |
| 7009906 | Semiconductor memory device having easily redesigned memory capacity | — | 2006-03-07 |
| 6968207 | Communication system capable of speech and facsimile communication | Yosuke Ezumi, Takehiro Yoshida, Junji Iguchi, Shunichi Fujise, Yasuyuki Nakamura | 2005-11-22 |
| 6888776 | Semiconductor memory device | Aiko Nishino, Katsumi Dosaka | 2005-05-03 |
| 6770188 | Part fabricating method | Masayuki Suda, Kazuyoshi Furuta | 2004-08-03 |
| 6519057 | Image recording apparatus and mode switching method in the apparatus | Yuji Kurosawa | 2003-02-11 |
| 6473352 | Semiconductor integrated circuit device having efficiently arranged link program circuitry | Aiko Nishino, Katsumi Dosaka | 2002-10-29 |