AH

Atsushi Hachisuka

Mitsubishi Electric: 36 patents #307 of 25,717Top 2%
RT Renesas Technology: 4 patents #758 of 3,337Top 25%
RE Renesas Electronics: 2 patents #1,855 of 4,529Top 45%
📍 Kasai, JP: #109 of 5,842 inventorsTop 2%
Overall (All Time): #73,951 of 4,157,543Top 2%
42
Patents All Time

Issued Patents All Time

Showing 1–25 of 42 patents

Patent #TitleCo-InventorsDate
8072074 Semiconductor device and method of manufacturing same Atsushi Amo, Tatsuo Kasaoka, Shunji Kubo 2011-12-06
7884480 Semiconductor device and method of manufacturing same Atsushi Amo, Tatsuo Kasaoka, Shunji Kubo 2011-02-08
7563668 Semiconductor device and method of manufacturing same Atsushi Amo, Tatsuo Kasaoka, Shunji Kubo 2009-07-21
7145240 Semiconductor device having a capacitor and method of manufacturing the same Atsushi Amo, Tatsuo Kasaoka, Shunji Kubo 2006-12-05
6798006 Semiconductor device and manufacturing method thereof Atsushi Amo, Tatsuo Kasaoka 2004-09-28
6784066 Method for manufacturing semiconductor device and semiconductor device manufactured thereby 2004-08-31
6765251 Semiconductor device having interconnection structure Eiji Hasunuma, Hideki Genjo, Shigeru Shiratake, Koji Taniguchi 2004-07-20
6486516 Semiconductor device and a method of producing the same 2002-11-26
6388295 Semiconductor device and method of manufacturing the same Tomohiro Yamashita, Yoshinori Okumura, Shinya Soeda 2002-05-14
6331462 Manufacturing method of a semiconductor device for desired circuit patterns Tatsuo Kasaoka, Shinya Soeda 2001-12-18
6323560 Registration accuracy measurement mark, method of repairing defect of the mark, photomask having the mark, method of manufacturing the photo mask and method of exposure thereof Koichiro Narimatsu, Shigenori Yamashita, Nobuyuki Yoshioka, Shinya Soeda, Koji Taniguchi +3 more 2001-11-27
6313032 Method for manufacturing a salicide transistor, semiconductor storage, and semiconductor device Keiichi Yamada 2001-11-06
6309931 Method of making a semiconductor device with sidewall insulating layers in the capacitor contact hole Takeshi Noguchi 2001-10-30
6218235 Method of manufacturing a DRAM and logic device Hiroyasu Nohsoh, Shinya Soeda 2001-04-17
6163062 Semiconductor device having a metallic fuse member and cutting method thereof with laser light Shigeru Shiratake, Hideki Genjo, Yasuhiro Ido, Koji Taniguchi 2000-12-19
6160284 Semiconductor device with sidewall insulating layers in the capacitor contact hole Takeshi Noguchi 2000-12-12
6068952 Registration accuracy measurement mark, method of repairing defect of the mark, photomask having the mark, method of manufacturing the photomask and method of exposure thereof Koichiro Narimatsu, Shigenori Yamashita, Nobuyuki Yoshioka, Shinya Soeda, Koji Taniguchi +3 more 2000-05-30
5892291 Registration accuracy measurement mark Koichiro Narimatsu, Shigenori Yamashita, Nobuyuki Yoshioka, Shinya Soeda, Koji Taniguchi +3 more 1999-04-06
5892702 Semiconductor memory device and method of manufacturing the same Tatsuo Okamoto, Hideaki Arima, Mitsuya Kinoshita 1999-04-06
5798289 Method of manufacturing stacked capacitors in a DRAM with reduced isolation region between adjacent capacitors Natsuo Ajika, Hideaki Arima 1998-08-25
5672533 Field effect transistor having impurity regions of different depths and manufacturing method thereof Hideaki Arima, Makoto Ohi, Natsuo Ajika, Tomonori Okudaira 1997-09-30
5627093 Method of manufacturing a wiring layer for use in a semiconductor device having a plurality of conductive layers Yoshinori Okumura 1997-05-06
5597755 Method of manufacturing a stacked capacitor in a dram Natsuo Ajika, Hideaki Arima 1997-01-28
5580813 Method of forming a semiconductor memory device having a contact region between memory cell and an interlayer insolating layer Kazuhiro Tsukamoto, Mitsuya Kinoshita 1996-12-03
5578861 Semiconductor device having redundant circuit Mitsuya Kinoshita, Kazuhiro Tsukamoto 1996-11-26