AH

Atsushi Hachisuka

Mitsubishi Electric: 36 patents #307 of 25,717Top 2%
RT Renesas Technology: 4 patents #758 of 3,337Top 25%
RE Renesas Electronics: 2 patents #1,855 of 4,529Top 45%
📍 Kasai, JP: #109 of 5,842 inventorsTop 2%
Overall (All Time): #73,951 of 4,157,543Top 2%
42
Patents All Time

Issued Patents All Time

Showing 26–42 of 42 patents

Patent #TitleCo-InventorsDate
5506164 Method of manufacturing a semiconductor device having a cylindrical capacitor Mitsuya Kinoshita, Tatsuo Okamoto, Hideaki Arima 1996-04-09
5502324 Composite wiring layer Yoshinori Okumura 1996-03-26
5489791 Field effect transistor having impurity regions of different depths and manufacturing method thereof Hideaki Arima, Makoto Ohi, Natsuo Ajika, Tomonori Okudaira 1996-02-06
5448512 Semiconductor memory device with contact region intermediate memory cell and peripheral circuit Kazuhiro Tsukamoto, Mitsuya Kinoshita 1995-09-05
5434439 Dynamic random access memory having stacked type capacitor and manufacturing method therefor Natsuo Ajika, Hideaki Arima 1995-07-18
5408114 Semiconductor memory device having cylindrical capacitor and manufacturing method thereof Mitsuya Kinoshita, Tatsuo Okamoto, Hideaki Arima 1995-04-18
5381365 Dynamic random access memory having stacked type capacitor and manufacturing method therefor Natsuo Ajika, Hideaki Arima 1995-01-10
5364811 Method of manufacturing a semiconductor memory device with multiple device forming regions Natsuo Ajika, Hideaki Arima, Kaoru Motonami, Tomonori Okudaira 1994-11-15
5338699 Method of making a semiconductor integrated device having gate sidewall structure Makoto Ohi, Hideaki Arima, Natsuo Ajika, Yasushi Matsui 1994-08-16
5300444 Method of manufacturing a semiconductor device having a stacked structure formed of polycrystalline silicon film and silicon oxide film Masao Nagatomo, Ikuo Ogoh, Hideki Genjou, Yoshinori Okumura, Takayuki Matsukawa 1994-04-05
5281838 Semiconductor device having contact between wiring layer and impurity region Yoshinori Okumura 1994-01-25
5276344 Field effect transistor having impurity regions of different depths and manufacturing method thereof Hideaki Arima, Makoto Ohi, Natsuo Ajika, Tomonori Okudaira 1994-01-04
5240872 Method of manufacturing semiconductor device having interconnection layer contacting source/drain regions Kaoru Motonami, Natsuo Ajika, Yoshinori Okumura, Yasushi Matsui 1993-08-31
5233212 Semiconductor device having gate electrode spacing dependent upon gate side wall insulating dimension Makoto Ohi, Hideaki Arima, Natsuo Ajika, Yasushi Matsui 1993-08-03
5218219 Semiconductor memory device having a peripheral wall at the boundary region of a memory cell array region and a peripheral circuit region Natsuo Ajika, Hideaki Arima, Kaoru Motonami, Tomonori Okudaira 1993-06-08
5173752 Semiconductor device having interconnection layer contacting source/drain regions Kaoru Motonami, Natsuo Ajika, Yoshinori Okumura, Yasushi Matsui 1992-12-22
5153689 Semiconductor memory device having bit lines formed of an interconnecting layer of lower reflectance material than the material of the word lines Yoshinori Okumura, Takayuki Matsukawa, Ikuo Ogoh, Masao Nagatomo, Hideki Genjo 1992-10-06