Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6822279 | Semiconductor device and method of fabricating the same | — | 2004-11-23 |
| 6680539 | Semiconductor device, semiconductor device pattern designing method, and semiconductor device pattern designing apparatus | Hiroyasu Nohsoh, Hiroki Shinkawata | 2004-01-20 |
| 6670680 | Semiconductor device comprising a dual gate CMOS | Hiroyasu Nohsoh | 2003-12-30 |
| 6607964 | Method of manufacturing semiconductor device | Hidenori Sato | 2003-08-19 |
| 6388295 | Semiconductor device and method of manufacturing the same | Tomohiro Yamashita, Yoshinori Okumura, Atsushi Hachisuka | 2002-05-14 |
| 6355387 | Method of making a mask pattern | Masato Fujinaga | 2002-03-12 |
| 6331462 | Manufacturing method of a semiconductor device for desired circuit patterns | Tatsuo Kasaoka, Atsushi Hachisuka | 2001-12-18 |
| 6323560 | Registration accuracy measurement mark, method of repairing defect of the mark, photomask having the mark, method of manufacturing the photo mask and method of exposure thereof | Koichiro Narimatsu, Shigenori Yamashita, Nobuyuki Yoshioka, Atsushi Hachisuka, Koji Taniguchi +3 more | 2001-11-27 |
| 6218235 | Method of manufacturing a DRAM and logic device | Atsushi Hachisuka, Hiroyasu Nohsoh | 2001-04-17 |
| 6068952 | Registration accuracy measurement mark, method of repairing defect of the mark, photomask having the mark, method of manufacturing the photomask and method of exposure thereof | Koichiro Narimatsu, Shigenori Yamashita, Nobuyuki Yoshioka, Atsushi Hachisuka, Koji Taniguchi +3 more | 2000-05-30 |
| 5892291 | Registration accuracy measurement mark | Koichiro Narimatsu, Shigenori Yamashita, Nobuyuki Yoshioka, Atsushi Hachisuka, Koji Taniguchi +3 more | 1999-04-06 |
| 5329146 | DRAM having trench type capacitor extending through field oxide | — | 1994-07-12 |