Issued Patents All Time
Showing 51–75 of 86 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6269451 | Method and apparatus for adjusting data timing by delaying clock signal | — | 2001-07-31 |
| 6255838 | Apparatus and method for disabling and re-enabling access to IC test functions | Daryl L. Habersetzer, Casey Kurth, Jason Graalum | 2001-07-03 |
| 6255837 | Apparatus and method disabling and re-enabling access to IC test functions | Daryl L. Habersetzer, Casey Kurth, Jason Graalum | 2001-07-03 |
| 6252816 | Circuit and method for refreshing data stored in a memory cell | — | 2001-06-26 |
| 6243285 | ROM-embedded-DRAM | Casey Kurth, Scott J. Derner | 2001-06-05 |
| 6236606 | Row decoded biasing of sense amplifier for improved one's margin | Scott J. Derner | 2001-05-22 |
| 6208577 | Circuit and method for refreshing data stored in a memory cell | — | 2001-03-27 |
| 6194738 | Method and apparatus for storage of test results within an integrated circuit | Brett Debenham, Kim Pierce, Douglas J. Cutter, Kurt D. Beigel, Fan Ho +6 more | 2001-02-27 |
| 6192446 | Memory device with command buffer | Casey Kurth, Scott J. Derner | 2001-02-20 |
| 6185705 | Method and apparatus for checking the resistance of programmable elements | Douglas J. Cutter, Adrian E. Ong, Fan Ho, Kurt D. Beigel, Brett Debenham +2 more | 2001-02-06 |
| 6160413 | Apparatus and method for disabling and re-enabling access to IC test functions | Daryl L. Habersetzer, Casey Kurth, Jason Graalum | 2000-12-12 |
| 6154410 | Method and apparatus for reducing antifuse programming time | Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Dien Luong +2 more | 2000-11-28 |
| 6141276 | Apparatus and method for increasing test flexibility of a memory device | Michael A. Shore | 2000-10-31 |
| 6137737 | Method and circuit for rapidly equilibrating paired digit lines of a memory device during testing | Casey Kurth | 2000-10-24 |
| 6134152 | Device and method for supplying current to a semiconductor memory to support a boosted voltage within the memory during testing | — | 2000-10-17 |
| 6134137 | Rom-embedded-DRAM | Casey Kurth, Scott J. Derner | 2000-10-17 |
| 6130834 | Circuit for programming antifuse bits | Casey Kurth, Jason Graalum, Daryl L. Habersetzer | 2000-10-10 |
| 6115306 | Method and apparatus for multiple row activation in memory devices | Michael A. Shore | 2000-09-05 |
| 6111451 | Efficient VCCP supply with regulation for voltage control | Mohamed Imam | 2000-08-29 |
| 6111803 | Reduced cell voltage for memory device | Scott J. Derner | 2000-08-29 |
| 6075737 | Row decoded biasing of sense amplifier for improved one's margin | Scott J. Derner | 2000-06-13 |
| 6055173 | Circuit for programming antifuse bits | Casey Kurth, Jason Graalum, Daryl L. Habersetzer | 2000-04-25 |
| 6023434 | Method and apparatus for multiple row activation in memory devices | Michael A. Shore | 2000-02-08 |
| 6005812 | Device and method for supplying current to a semiconductor memory to support a boosted voltage within the memory during testing | — | 1999-12-21 |
| 5982656 | Method and apparatus for checking the resistance of programmable elements | Douglas J. Cutter, Fan Ho, Kurt D. Beigel, Brett Debenham, Dien Luong +1 more | 1999-11-09 |