Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6983404 | Method and apparatus for checking the resistance of programmable elements | Douglas J. Cutter, Adrian E. Ong, Fan Ho, Kurt D. Beigel, Brett Debenham +2 more | 2006-01-03 |
| 6365421 | Method and apparatus for storage of test results within an integrated circuit | Brett Debenham, Kim Pierce, Douglas J. Cutter, Kurt D. Beigel, Fan Ho +6 more | 2002-04-02 |
| 6194738 | Method and apparatus for storage of test results within an integrated circuit | Brett Debenham, Kim Pierce, Douglas J. Cutter, Kurt D. Beigel, Fan Ho +6 more | 2001-02-27 |
| 6185705 | Method and apparatus for checking the resistance of programmable elements | Douglas J. Cutter, Adrian E. Ong, Fan Ho, Kurt D. Beigel, Brett Debenham +2 more | 2001-02-06 |
| 6154410 | Method and apparatus for reducing antifuse programming time | Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey +2 more | 2000-11-28 |
| 5982656 | Method and apparatus for checking the resistance of programmable elements | Douglas J. Cutter, Fan Ho, Kurt D. Beigel, Brett Debenham, Kim Pierce +1 more | 1999-11-09 |
| 5706238 | Self current limiting antifuse circuit | Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey +2 more | 1998-01-06 |
| 5631862 | Self current limiting antifuse circuit | Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey +2 more | 1997-05-20 |