| 6983404 |
Method and apparatus for checking the resistance of programmable elements |
Douglas J. Cutter, Adrian E. Ong, Fan Ho, Kurt D. Beigel, Brett Debenham +2 more |
2006-01-03 |
| 6365421 |
Method and apparatus for storage of test results within an integrated circuit |
Brett Debenham, Kim Pierce, Douglas J. Cutter, Kurt D. Beigel, Fan Ho +6 more |
2002-04-02 |
| 6194738 |
Method and apparatus for storage of test results within an integrated circuit |
Brett Debenham, Kim Pierce, Douglas J. Cutter, Kurt D. Beigel, Fan Ho +6 more |
2001-02-27 |
| 6185705 |
Method and apparatus for checking the resistance of programmable elements |
Douglas J. Cutter, Adrian E. Ong, Fan Ho, Kurt D. Beigel, Brett Debenham +2 more |
2001-02-06 |
| 6154410 |
Method and apparatus for reducing antifuse programming time |
Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey +2 more |
2000-11-28 |
| 5982656 |
Method and apparatus for checking the resistance of programmable elements |
Douglas J. Cutter, Fan Ho, Kurt D. Beigel, Brett Debenham, Kim Pierce +1 more |
1999-11-09 |
| 5706238 |
Self current limiting antifuse circuit |
Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey +2 more |
1998-01-06 |
| 5631862 |
Self current limiting antifuse circuit |
Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey +2 more |
1997-05-20 |
