BD

Brett Debenham

Micron: 15 patents #1,089 of 6,345Top 20%
Overall (All Time): #326,777 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7237158 Intelligent binning for electrically repairable semiconductor chips 2007-06-26
6983404 Method and apparatus for checking the resistance of programmable elements Douglas J. Cutter, Adrian E. Ong, Fan Ho, Kurt D. Beigel, Dien Luong +2 more 2006-01-03
6587980 Intelligent binning for electrically repairable semiconductor chips 2003-07-01
6523144 Intelligent binning for electrically repairable semiconductor chips and method 2003-02-18
6365421 Method and apparatus for storage of test results within an integrated circuit Kim Pierce, Douglas J. Cutter, Kurt D. Beigel, Fan Ho, Patrick J. Mullarkey +6 more 2002-04-02
6321353 Intelligent binning for electrically repairable semiconductor chips 2001-11-20
6219810 Intelligent binning for electrically repairable semiconductor chips 2001-04-17
6194738 Method and apparatus for storage of test results within an integrated circuit Kim Pierce, Douglas J. Cutter, Kurt D. Beigel, Fan Ho, Patrick J. Mullarkey +6 more 2001-02-27
6185705 Method and apparatus for checking the resistance of programmable elements Douglas J. Cutter, Adrian E. Ong, Fan Ho, Kurt D. Beigel, Dien Luong +2 more 2001-02-06
6154410 Method and apparatus for reducing antifuse programming time Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey +2 more 2000-11-28
6138256 Intelligent binning for electrically repairable semiconductor chips 2000-10-24
5982656 Method and apparatus for checking the resistance of programmable elements Douglas J. Cutter, Fan Ho, Kurt D. Beigel, Dien Luong, Kim Pierce +1 more 1999-11-09
5764650 Intelligent binning for electrically repairable semiconductor chips 1998-06-09
5706238 Self current limiting antifuse circuit Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey +2 more 1998-01-06
5631862 Self current limiting antifuse circuit Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey +2 more 1997-05-20