| 6983404 |
Method and apparatus for checking the resistance of programmable elements |
Douglas J. Cutter, Adrian E. Ong, Fan Ho, Kurt D. Beigel, Brett Debenham +2 more |
2006-01-03 |
| 6665827 |
Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system for utilizing the semiconductor integrated circuit |
Roland Ochoa, Gregory L. Cowan |
2003-12-16 |
| 6546512 |
Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit |
Roland Ochoa, Gregory L. Cowan |
2003-04-08 |
| 6536004 |
On-chip circuit and method for testing memory devices |
Charles L. Ingalls |
2003-03-18 |
| 6365421 |
Method and apparatus for storage of test results within an integrated circuit |
Brett Debenham, Douglas J. Cutter, Kurt D. Beigel, Fan Ho, Patrick J. Mullarkey +6 more |
2002-04-02 |
| 6314538 |
Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit |
Roland Ochoa, Gregory L. Cowan |
2001-11-06 |
| 6194738 |
Method and apparatus for storage of test results within an integrated circuit |
Brett Debenham, Douglas J. Cutter, Kurt D. Beigel, Fan Ho, Patrick J. Mullarkey +6 more |
2001-02-27 |
| 6185705 |
Method and apparatus for checking the resistance of programmable elements |
Douglas J. Cutter, Adrian E. Ong, Fan Ho, Kurt D. Beigel, Brett Debenham +2 more |
2001-02-06 |
| 6178532 |
On-chip circuit and method for testing memory devices |
Charles L. Ingalls |
2001-01-23 |
| 6154410 |
Method and apparatus for reducing antifuse programming time |
Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey +2 more |
2000-11-28 |
| 5982656 |
Method and apparatus for checking the resistance of programmable elements |
Douglas J. Cutter, Fan Ho, Kurt D. Beigel, Brett Debenham, Dien Luong +1 more |
1999-11-09 |
| 5935263 |
Method and apparatus for memory array compressed data testing |
Brent Keeth, Troy A. Manning, Chris G. Martin, Wallace E. Fister, Kevin J. Ryan +3 more |
1999-08-10 |
| 5864565 |
Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit |
Roland Ochoa, Gregory L. Cowan |
1999-01-26 |
| 5706238 |
Self current limiting antifuse circuit |
Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey +2 more |
1998-01-06 |
| 5631862 |
Self current limiting antifuse circuit |
Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey +2 more |
1997-05-20 |
