Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6983404 | Method and apparatus for checking the resistance of programmable elements | Douglas J. Cutter, Adrian E. Ong, Fan Ho, Kurt D. Beigel, Brett Debenham +2 more | 2006-01-03 |
| 6665827 | Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system for utilizing the semiconductor integrated circuit | Roland Ochoa, Gregory L. Cowan | 2003-12-16 |
| 6546512 | Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit | Roland Ochoa, Gregory L. Cowan | 2003-04-08 |
| 6536004 | On-chip circuit and method for testing memory devices | Charles L. Ingalls | 2003-03-18 |
| 6365421 | Method and apparatus for storage of test results within an integrated circuit | Brett Debenham, Douglas J. Cutter, Kurt D. Beigel, Fan Ho, Patrick J. Mullarkey +6 more | 2002-04-02 |
| 6314538 | Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit | Roland Ochoa, Gregory L. Cowan | 2001-11-06 |
| 6194738 | Method and apparatus for storage of test results within an integrated circuit | Brett Debenham, Douglas J. Cutter, Kurt D. Beigel, Fan Ho, Patrick J. Mullarkey +6 more | 2001-02-27 |
| 6185705 | Method and apparatus for checking the resistance of programmable elements | Douglas J. Cutter, Adrian E. Ong, Fan Ho, Kurt D. Beigel, Brett Debenham +2 more | 2001-02-06 |
| 6178532 | On-chip circuit and method for testing memory devices | Charles L. Ingalls | 2001-01-23 |
| 6154410 | Method and apparatus for reducing antifuse programming time | Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey +2 more | 2000-11-28 |
| 5982656 | Method and apparatus for checking the resistance of programmable elements | Douglas J. Cutter, Fan Ho, Kurt D. Beigel, Brett Debenham, Dien Luong +1 more | 1999-11-09 |
| 5935263 | Method and apparatus for memory array compressed data testing | Brent Keeth, Troy A. Manning, Chris G. Martin, Wallace E. Fister, Kevin J. Ryan +3 more | 1999-08-10 |
| 5864565 | Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit | Roland Ochoa, Gregory L. Cowan | 1999-01-26 |
| 5706238 | Self current limiting antifuse circuit | Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey +2 more | 1998-01-06 |
| 5631862 | Self current limiting antifuse circuit | Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey +2 more | 1997-05-20 |