Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8687435 | System and method for reducing pin-count of memory devices, and memory device testers for same | Scott N. Gatzemeier, Adam Johnson, Benjamin Louie | 2014-04-01 |
| 8400844 | System and method for reducing pin-count of memory devices, and memory device testers for same | Scott N. Gatzemeier, Adam Johnson, Ben Louie | 2013-03-19 |
| 8072820 | System and method for reducing pin-count of memory devices, and memory device testers for same | Scott N. Gatzemeier, Adam Johnson, Ben Louie | 2011-12-06 |
| 7554858 | System and method for reducing pin-count of memory devices, and memory device testers for same | Scott N. Gatzemeier, Adam Johnson, Ben Louie | 2009-06-30 |
| 6839292 | Apparatus and method for parallel programming of antifuses | Scott N. Gatzemeier | 2005-01-04 |
| 6538938 | Method for generating memory addresses for accessing memory-cell arrays in memory devices | — | 2003-03-25 |
| 6510102 | Method for generating memory addresses for accessing memory-cell arrays in memory devices | — | 2003-01-21 |
| 6483773 | Method for generating memory addresses for testing memory devices | — | 2002-11-19 |
| 6452868 | Method for generating memory addresses for accessing memory-cell arrays in memory devices | — | 2002-09-17 |
| 6327199 | Method for testing memory devices | — | 2001-12-04 |
| 6324657 | On-clip testing circuit and method for improving testing of integrated circuits | Aaron Schoenfeld | 2001-11-27 |
| 6285609 | Method and apparatus for testing memory devices | — | 2001-09-04 |
| 6252811 | Method and apparatus for testing memory devices | — | 2001-06-26 |
| 6115303 | Method and apparatus for testing memory devices | — | 2000-09-05 |
| 6104669 | Method and apparatus for generating memory addresses for testing memory devices | — | 2000-08-15 |
| 6049505 | Method and apparatus for generating memory addresses for testing memory devices | — | 2000-04-11 |
| 5935263 | Method and apparatus for memory array compressed data testing | Brent Keeth, Troy A. Manning, Chris G. Martin, Kim Pierce, Kevin J. Ryan +3 more | 1999-08-10 |