SG

Scott N. Gatzemeier

Micron: 17 patents #998 of 6,345Top 20%
📍 Boise, ID: #552 of 3,546 inventorsTop 20%
🗺 Idaho: #820 of 8,810 inventorsTop 10%
Overall (All Time): #277,337 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
8687435 System and method for reducing pin-count of memory devices, and memory device testers for same Wallace E. Fister, Adam Johnson, Benjamin Louie 2014-04-01
8400844 System and method for reducing pin-count of memory devices, and memory device testers for same Wallace E. Fister, Adam Johnson, Ben Louie 2013-03-19
8094508 Memory block testing Joemar Sinipete, Nevil N. Gajera, Mark Hawes 2012-01-10
8072820 System and method for reducing pin-count of memory devices, and memory device testers for same Wallace E. Fister, Adam Johnson, Ben Louie 2011-12-06
8024629 Input/output compression and pin reduction in an integrated circuit Benjamin Louie, Adam Johnson, Frankie F. Roohparvar 2011-09-20
7707467 Input/output compression and pin reduction in an integrated circuit Benjamin Louie, Adam Johnson, Frankie F. Roohparvar 2010-04-27
7620768 Multiple erase block tagging in a flash memory device Mitch Liu 2009-11-17
7567472 Memory block testing Joemar Sinipete, Nevil N. Gajera, Mark Hawes 2009-07-28
7554858 System and method for reducing pin-count of memory devices, and memory device testers for same Wallace E. Fister, Adam Johnson, Ben Louie 2009-06-30
7512507 Die based trimming Joemar Sinipete, Robert J. Ringhofer, Nevil N. Gajera, Mark Hawes 2009-03-31
7411848 Independent polling for multi-page programming June Lee 2008-08-12
7292487 Independent polling for multi-page programming June Lee 2007-11-06
7168018 Apparatus and method for reducing test resources in testing DRAMs Chris Cooper, Siang Tian Giam, Jerry McBride, Scott L. Ayres, David R. Brown 2007-01-23
7116584 Multiple erase block tagging in a flash memory device Mitch Liu 2006-10-03
6986084 Apparatus and method for reducing test resources in testing DRAMS Chris Cooper, Siang Tian Giam, Jerry McBride, Scott L. Ayres, David R. Brown 2006-01-10
6854079 Apparatus and method for reducing test resources in testing Rambus DRAMs Chris Cooper, Siang Tian Giam, Jerry McBride, Scott L. Ayres, David R. Brown 2005-02-08
6839292 Apparatus and method for parallel programming of antifuses Wallace E. Fister 2005-01-04