| 12315580 |
Built-in self-test circuitry |
William Yu, Daniele Balluchi, Danilo Caraccio, Thomas T. Tangelder, Jacob S. Robertson +1 more |
2025-05-27 |
| 11798622 |
Refresh operation of a memory cell |
John Christopher Sancon, Mingdong Cui |
2023-10-24 |
| 11404120 |
Refresh operation of a memory cell |
John Christopher Sancon, Mingdong Cui |
2022-08-02 |
| 10665307 |
Memory devices configured to perform leak checks |
Jeffrey Kessenich, Chiming Chu, Jason Lee Nevill, Kenneth W. Marr, Renato C. Padilla |
2020-05-26 |
| 10366767 |
Memory devices configured to perform leak checks |
Jeffrey Kessenich, Chiming Chu, Jason Lee Nevill, Kenneth W. Marr, Renato C. Padilla |
2019-07-30 |
| 9761322 |
Program operations with embedded leak checks |
Jeffery A. Kessenich, Chiming Chu, Jason Lee Nevill, Kenneth W. Marr, Renato C. Padilla |
2017-09-12 |
| 9281078 |
Program operations with embedded leak checks |
Jeffrey Kessenich, Chiming Chu, Jason Lee Nevill, Kenneth W. Marr, Renato C. Padilla |
2016-03-08 |
| 8094508 |
Memory block testing |
Scott N. Gatzemeier, Nevil N. Gajera, Mark Hawes |
2012-01-10 |
| 7567472 |
Memory block testing |
Scott N. Gatzemeier, Nevil N. Gajera, Mark Hawes |
2009-07-28 |
| 7512507 |
Die based trimming |
Scott N. Gatzemeier, Robert J. Ringhofer, Nevil N. Gajera, Mark Hawes |
2009-03-31 |
