WY

William Yu

Micron: 2 patents #3,728 of 6,345Top 60%
Overall (All Time): #1,711,164 of 4,157,543Top 45%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12315580 Built-in self-test circuitry Daniele Balluchi, Danilo Caraccio, Thomas T. Tangelder, Jacob S. Robertson, James G. Steele +1 more 2025-05-27
12293803 Built-in self-test burst patterns based on architecture of memory Daniele Balluchi, Chad B. Erickson, Danilo Caraccio 2025-05-06