Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12293803 | Built-in self-test burst patterns based on architecture of memory | William Yu, Daniele Balluchi, Danilo Caraccio | 2025-05-06 |
CE
Chad B. Erickson
Overall (All Time): #2,411,698 of 4,157,543Top 60%
1
Patents All Time