Built-in self-test circuitry

Assignee

• Micron

Inventors

• William Yu (2 patents)
• Daniele Balluchi (100 patents)
• Danilo Caraccio (103 patents)
• Thomas T. Tangelder (1 patents)
• Jacob S. Robertson (1 patents)
• James G. Steele (1 patents)
• Joemar Sinipete (10 patents)

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