Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for storage of test results within an integrated circuit

Method and apparatus for storage of test results within an integrated circuit

US Patent 6194738 · Granted Feb 27, 2001

Estimated economic value: $17,116,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Use of residual iron within granulated metallic unit production facilities, and 2025
Continuous granulated metallic units production, and associated systems, devices2025
Low-carbon granulated metallic units2025
Use of a basic oxygen furnace to produce granulated metallic units, and associat2025
Low-sulfur granulated metallic units2025
Treating cooling water in iron production facilities, and associated systems, de2025
Multi-modal memory apparatuses and systems2025
Computer-readable media and methods for generating a geospatial image map2025
Communicating data with stacked memory dies2025
Memory having internal processors and data communication methods in memory2025
Controller to detect malfunctioning address of memory device2025
Controller to detect malfunctioning address of memory device2025