Issued Patents All Time
Showing 25 most recent of 126 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12230350 | Controller to detect malfunctioning address of memory device | Fan Ho | 2025-02-18 |
| 11783910 | Controller to detect malfunctioning address of memory device | Fan Ho | 2023-10-10 |
| 11621027 | MRAM architecture with multiplexed sense amplifiers and direct write through buffers | — | 2023-04-04 |
| 11501848 | Controller to detect malfunctioning address of memory device | Fan Ho | 2022-11-15 |
| 11270931 | Isolating electric paths in semiconductor device packages | Dong Sik Jeong | 2022-03-08 |
| 11037652 | Controller to detect malfunctioning address of memory device | Fan Ho | 2021-06-15 |
| 11009548 | Testing fuse configurations in semiconductor devices | Paul Fuller, Nick van Heel, Mark R. Thomann | 2021-05-18 |
| 10867691 | Controller to detect malfunctioning address of memory device | Fan Ho | 2020-12-15 |
| 10854255 | Vertical selector stt-MRAM architecture | Andrew J. Walker, Dafna Beery | 2020-12-01 |
| 10840298 | Vertical selector STT-MRAM architecture | Andrew J. Walker, Dafna Beery | 2020-11-17 |
| 10818334 | Ferroelectric memory array with variable plate-line architecture | — | 2020-10-27 |
| 10803918 | Ferroelectric memory array with hierarchical plate-line architecture | — | 2020-10-13 |
| 10446256 | Controller to detect malfunctioning address of memory device | Fan Ho | 2019-10-15 |
| 10302696 | Testing fuse configurations in semiconductor devices | Paul Fuller, Nick van Heel, Mark R. Thomann | 2019-05-28 |
| 10114073 | Integrated circuit testing | — | 2018-10-30 |
| 10032500 | Memory disturb recovery scheme for cross-point memory arrays | Charles Cheng | 2018-07-24 |
| 10008291 | Controller to detect malfunctioning address of memory device | Fan Ho | 2018-06-26 |
| 9899312 | Isolating electric paths in semiconductor device packages | Dong Sik Jeong | 2018-02-20 |
| 9679664 | Method and system for providing a smart memory architecture | — | 2017-06-13 |
| 9659671 | Controller to detect malfunctioning address of memory device | Fan Ho | 2017-05-23 |
| 9653151 | Memory array having segmented row addressed page registers | Bruce L. Bateman | 2017-05-16 |
| 9607681 | Memory device that supports multiple memory configurations | Byeong Cheol Na, Tim Lao | 2017-03-28 |
| 9568544 | Testing fuse configurations in semiconductor devices | Paul Fuller, Nick van Heel, Mark R. Thomann | 2017-02-14 |
| 9378849 | Controller to detect malfunctioning address of memory device | Fan Ho | 2016-06-28 |
| 9269460 | Controller to detect malfunctioning address of memory device | Fan Ho | 2016-02-23 |