Issued Patents All Time
Showing 51–75 of 126 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8063650 | Testing fuse configurations in semiconductor devices | Paul Fuller, Nick van Heel, Mark R. Thomann | 2011-11-22 |
| 8001439 | Integrated circuit testing module including signal shaping interface | — | 2011-08-16 |
| 7991572 | Delay lock loop delay adjusting method and apparatus | Douglas W. Gorgen | 2011-08-02 |
| 7945824 | Processor-memory unit for use in system-in-package and system-in-module devices | Naresh Baliga | 2011-05-17 |
| 7779311 | Testing and recovery in a multilayer device | — | 2010-08-17 |
| 7768847 | Programmable memory repair scheme | Fan Ho | 2010-08-03 |
| 7706998 | Delay lock loop delay adjusting method and apparatus | Douglas W. Gorgen | 2010-04-27 |
| 7673193 | Processor-memory unit for use in system-in-package and system-in-module devices | Naresh Baliga | 2010-03-02 |
| 7593271 | Memory device including multiplexed inputs | — | 2009-09-22 |
| 7466160 | Shared memory bus architecture for system with processor and memory units | Naresh Baliga, Chiate Lin | 2008-12-16 |
| 7466603 | Memory accessing circuit system | — | 2008-12-16 |
| 7446551 | Integrated circuit testing module including address generator | — | 2008-11-04 |
| 7444575 | Architecture and method for testing of an integrated circuit device | — | 2008-10-28 |
| 7443188 | Electronic device having an interface supported testing mode | — | 2008-10-28 |
| 7404117 | Component testing and recovery | Richard G. Egan | 2008-07-22 |
| 7370256 | Integrated circuit testing module including data compression | — | 2008-05-06 |
| 7365557 | Integrated circuit testing module including data generator | — | 2008-04-29 |
| 7313740 | Internally generating patterns for testing in an integrated circuit device | — | 2007-12-25 |
| 7309999 | Electronic device having an interface supported testing mode | — | 2007-12-18 |
| 7310000 | Integrated circuit testing module including command driver | — | 2007-12-18 |
| 7307442 | Integrated circuit test array including test module | — | 2007-12-11 |
| 7269524 | Delay lock loop delay adjusting method and apparatus | Douglas W. Gorgen | 2007-09-11 |
| 7265570 | Integrated circuit testing module | — | 2007-09-04 |
| 7259582 | Bonding pads for testing of a semiconductor device | — | 2007-08-21 |
| 7245141 | Shared bond pad for testing a memory within a packaged semiconductor device | — | 2007-07-17 |