Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11009548 | Testing fuse configurations in semiconductor devices | Adrian E. Ong, Paul Fuller, Mark R. Thomann | 2021-05-18 |
| 8063650 | Testing fuse configurations in semiconductor devices | Adrian E. Ong, Paul Fuller, Mark R. Thomann | 2011-11-22 |
| 6266272 | Partially non-volatile dynamic random access memory formed by a plurality of single transistor cells used as DRAM cells and EPROM cells | Toshiaki Kirihata, Daniel W. Storaska, Chandrasekhar Narayan, William R. Tonti, Claude L. Bertin | 2001-07-24 |