Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11962674 | MIPI translation in gigabit multimedia serial link | Yan Yan, Gary Murdock, Prem Ramachandran Nayar | 2024-04-16 |
| 11595504 | MIPI translation in GMSL tunnel mode | Yan Yan, Gary Murdock, Prem Ramachandran Nayar | 2023-02-28 |
| 11009548 | Testing fuse configurations in semiconductor devices | Adrian E. Ong, Nick van Heel, Mark R. Thomann | 2021-05-18 |
| 10302696 | Testing fuse configurations in semiconductor devices | Adrian E. Ong, Nick van Heel, Mark R. Thomann | 2019-05-28 |
| 9568544 | Testing fuse configurations in semiconductor devices | Adrian E. Ong, Nick van Heel, Mark R. Thomann | 2017-02-14 |
| 8717052 | Testing fuse configurations in semiconductor devices | Adrian E. Ong, Nick van Heel, Mark R. Thomann | 2014-05-06 |
| 8063650 | Testing fuse configurations in semiconductor devices | Adrian E. Ong, Nick van Heel, Mark R. Thomann | 2011-11-22 |
| 7613965 | Apparatus and method for high-speed SAS link protocol testing | Arthur J. Gregorcyk | 2009-11-03 |
| 7370253 | Apparatus and method for high-speed SAS link protocol testing | Arthur J. Gregorcyk | 2008-05-06 |
| 7305509 | Method and apparatus for zero stub serial termination capacitor of resistor mounting option in an information handling system | Jason Lau | 2007-12-04 |
| 6889357 | Timing calibration pattern for SLDRAM | Brent Keeth, Brian Johnson, Terry R. Lee | 2005-05-03 |
| 6550026 | High speed test system for a memory device | Jeffrey P. Wright, Hua Zheng | 2003-04-15 |
| 6154860 | High-speed test system for a memory device | Jeffrey P. Wright, Hua Zheng | 2000-11-28 |
| 6055611 | Method and apparatus for enabling redundant memory | Jeffrey P. Wright | 2000-04-25 |
| 5966388 | High-speed test system for a memory device | Jeffrey P. Wright, Hua Zheng | 1999-10-12 |
| 5945845 | Method and apparatus for enhanced booting and DC conditions | Mark R. Thomann | 1999-08-31 |
| 5783948 | Method and apparatus for enhanced booting and DC conditions | Mark R. Thomann | 1998-07-21 |