Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system for utilizing the semiconductor integrated circuit

Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system for utilizing the semiconductor integrated circuit

US Patent 6665827 · Granted Dec 16, 2003

Estimated economic value: $2,294,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for checking the resistance of programmable elements2006
Soft error detection for digital signal processors2003
Semiconductor integrated circuit having compression circuitry for compressing te2003
Semiconductor integrated circuit having compression circuitry for compressing te2003
Semiconductor integrated circuit having compression circuitry for compressing te2003
On-chip circuit and method for testing memory devices2003
Method and apparatus for storage of test results within an integrated circuit2002
Buffering circuit embedded in an integrated circuit device module used for buffe2002
Semiconductor integrated circuit having compression circuitry for compressing te2001
Semiconductor integrated circuit having compression circuitry for compressing te2001
Semiconductor integrated circuit having compression circuitry for compressing te2001
System for identifying a component with physical characterization2001