Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6665827 | Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system for utilizing the semiconductor integrated circuit | Roland Ochoa, Kim Pierce | 2003-12-16 |
| 6546512 | Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit | Roland Ochoa, Kim Pierce | 2003-04-08 |
| 6314538 | Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit | Roland Ochoa, Kim Pierce | 2001-11-06 |
| 6016561 | Output data compression scheme for use in testing IC memories | Fariborz F. Roohparvar, Allahyar Vahidi Mowlavi, Mark Hawes | 2000-01-18 |
| 5864565 | Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit | Roland Ochoa, Kim Pierce | 1999-01-26 |
| 5787097 | Output data compression scheme for use in testing IC memories | Fariborz F. Roohparvar, Allahyar Vahidi Mowlavi, Mark Hawes | 1998-07-28 |