CW

Charles M. Watkins

Micron: 122 patents #107 of 6,345Top 2%
AI Aptina Imaging: 2 patents #130 of 332Top 40%
RR Round Rock Research: 2 patents #110 of 239Top 50%
📍 Eagle, ID: #5 of 278 inventorsTop 2%
🗺 Idaho: #70 of 8,810 inventorsTop 1%
Overall (All Time): #8,980 of 4,157,543Top 1%
126
Patents All Time

Issued Patents All Time

Showing 26–50 of 126 patents

Patent #TitleCo-InventorsDate
8384105 Light emitting diodes with enhanced thermal sinking and associated methods of operation Kevin Tetz 2013-02-26
8273589 Light emitting diodes and methods for manufacturing light emitting diodes 2012-09-25
8053857 Packaged microelectronic imagers and methods of packaging microelectronic imagers Salman Akram, Kyle K. Kirby, Alan G. Wood, William M. Hiatt 2011-11-08
7956443 Through-wafer interconnects for photoimager and memory wafers Salman Akram, Mark Hiatt, David R. Hembree, James M. Wark, Warren M. Farnworth +6 more 2011-06-07
7858429 Packaged microelectronic imagers and methods of packaging microelectronic imagers Salman Akram, Kyle K. Kirby, Alan G. Wood, William M. Hiatt 2010-12-28
7855140 Method of forming vias in semiconductor substrates and resulting structures Kyle K. Kirby, Alan G. Wood, Salman Akram, Warren M. Farnworth 2010-12-21
7795737 Methods of redistributing bondpad locations on an integrated circuit 2010-09-14
7759800 Microelectronics devices, having vias, and packaged microelectronic devices having vias Sidney B. Rigg, Kyle K. Kirby, Peter Benson, Salman Akram 2010-07-20
7709776 Microelectronic imagers with optical devices and methods of manufacturing such microelectronic imagers Warren M. Farnworth, Sidney B. Rigg, William M. Hiatt, Alan G. Wood, Peter Benson +4 more 2010-05-04
7683458 Through-wafer interconnects for photoimager and memory wafers Salman Akram, William M. Hiatt, David R. Hembree, James M. Wark, Warren M. Farnworth +6 more 2010-03-23
7629250 Method for creating electrically conductive elements for semiconductor device structures using laser ablation processes and methods of fabricating semiconductor device assemblies Peter Benson 2009-12-08
7598167 Method of forming vias in semiconductor substrates without damaging active regions thereof and resulting structures Kyle K. Kirby, Alan G. Wood, Salman Akram, Warren M. Farnworth 2009-10-06
7579684 Methods for packing microfeature devices and microfeature devices formed by such methods Peter Benson 2009-08-25
7575999 Method for creating conductive elements for semiconductor device structures using laser ablation processes and methods of fabricating semiconductor device assemblies Peter Benson 2009-08-18
7521296 Methods of fabricating a microlens including selectively curing flowable, uncured optically trasmissive material Alan G. Wood, Warren M. Farnworth, Peter Benson 2009-04-21
7504615 Microelectronic imagers with optical devices and methods of manufacturing such microelectronic imagers Warren M. Farnworth, Sidney B. Rigg, William M. Hiatt, Alan G. Wood, Peter Benson +4 more 2009-03-17
7498240 Microfeature workpieces, carriers, and associated methods William M. Hiatt 2009-03-03
7488618 Microlenses including a plurality of mutually adhered layers of optically transmissive material and systems including the same Alan G. Wood, Warren M. Farnworth, Peter Benson 2009-02-10
7456639 Compliant contact structure Kyle K. Kirby 2008-11-25
7442643 Methods of forming conductive elements using organometallic layers and flowable, curable conductive materials Alan G. Wood, Warren M. Farnworth, Peter Benson 2008-10-28
7439169 Integrated circuit and methods of redistributing bondpad locations 2008-10-21
7419841 Microelectronic imagers and methods of packaging microelectronic imagers Warren M. Farnworth, Sidney B. Rigg, William M. Hiatt, Kyle K. Kirby, Peter Benson +4 more 2008-09-02
7413979 Methods for forming vias in microelectronic devices, and methods for packaging microelectronic devices Sidney B. Rigg, Kyle K. Kirby, Peter Benson, Salman Akram 2008-08-19
7389581 Method of forming compliant contact structures Kyle K. Kirby 2008-06-24
7385412 Systems and methods for testing microfeature devices Salman Akram, William M. Hiatt, Alan G. Wood, Kyle K. Kirby 2008-06-10