YO

Yosuke Okamoto

KT Kabushiki Kaisha Toshiba: 13 patents #2,297 of 21,451Top 15%
Toshiba Memory: 4 patents #468 of 1,971Top 25%
TS Toshiba Medical Systems: 2 patents #467 of 1,088Top 45%
TO Toyota: 1 patents #15,335 of 26,838Top 60%
TA Tasmit: 1 patents #2 of 13Top 20%
SS Sumitomo Wiring Systems: 1 patents #1,603 of 2,615Top 65%
📍 Yokohama, JP: #298 of 480 inventorsTop 65%
Overall (All Time): #214,131 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDate
12243237 Pattern-edge detection method, pattern-edge detection apparatus, and storage medium storing program for causing a computer to perform pattern-edge detection 2025-03-04
10599056 Position measuring method, position measuring apparatus, and semiconductor device manufacturing method Miki Toshima, Osamu Yamane 2020-03-24
9952505 Imprint device and pattern forming method Nobuhiro Komine, Kazuhiro Segawa, Manabu Takakuwa, Kentaro Kasa 2018-04-24
9941177 Pattern accuracy detecting apparatus and processing system Kentaro Kasa, Kazuya Fukuhara, Kazutaka Ishigo, Manabu Takakuwa, Yoshinori Hagio +4 more 2018-04-10
9784573 Positional deviation measuring device, non-transitory computer-readable recording medium containing a positional deviation measuring program, and method of manufacturing semiconductor device Hidenori Sato, Nobuhiro Komine, Manabu Takakuwa 2017-10-10
9244365 Method for measuring pattern misalignment Yoshinori Hagio 2016-01-26
9146458 EUV mask Yoshinori Hagio 2015-09-29
8976356 Measurement mark, method for measurement, and measurement apparatus Nobuhiro Komine 2015-03-10
8953163 Exposure apparatus, exposure method, and method of manufacturing semiconductor device Kentaro Kasa, Manabu Takakuwa, Masamichi Kishimoto 2015-02-10
8914766 Dose-data generating apparatus Takashi Koike 2014-12-16
8859167 Pattern forming method, positional deviation measuring method and photomask Yoshinori Hagio 2014-10-14
8832607 Method for making correction map of dose amount, exposure method, and method for manufacturing semiconductor device Takashi Koike, Hiroyuki Mizuno 2014-09-09
8790851 Mask and method for fabricating semiconductor device Kazutaka Ishigo, Taketo Kuriyama 2014-07-29
8778570 Photomask and method for manufacturing the same Kentaro Okuda, Takaki Hashimoto, Hidenori Sato 2014-07-15
8504951 Dose-data generating apparatus, dose-data generating method, and manufacturing method of semiconductor device Takashi Koike 2013-08-06
8320658 Unevenness inspection method, method for manufacturing display panel, and unevenness inspection apparatus Hiroyuki Tanizaki, Naoko Toyoshima, Yasunori Takase 2012-11-27
7953263 X-ray CT apparatus and image processing apparatus Satoru Nakanishi 2011-05-31
7609803 Method for estimating scattered ray intensity in X-ray CT and X-ray CT apparatus Naruomi Akino 2009-10-27
7538448 Power supply circuit structure comprising a current sensor, and method of assembling the same Noriyuki Yoshida, Hiroyuki Wakamatsu 2009-05-26
7457741 Device for transmitting speech information Seiji Nakagawa, Kiyoshi Fujimoto, Yoh-ichi Fujisaka 2008-11-25