Issued Patents All Time
Showing 26–50 of 54 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9086036 | Evaporated fuel purge device | Tetsunori Inoguchi | 2015-07-21 |
| 8941378 | Magnetic sensor | Masayuki Obana, Hideto Ando | 2015-01-27 |
| 8850873 | Evaporated fuel leak detecting apparatus | Tomohiro Itoh, Mitsuyuki Kobayashi | 2014-10-07 |
| 8800360 | Vane pump apparatus and leak check system having the same | Tomohiro Itoh, Mitsuyuki Kobayashi | 2014-08-12 |
| 8549896 | Vane pump and evaporation leak check system using the same | Mitsuyuki Kobayashi, Tomohiro Itoh | 2013-10-08 |
| 8198886 | Magnetic detecting device and method for manufacturing the same | Hideto Ando, Shinichi Sasaki | 2012-06-12 |
| 8019144 | Pattern image correcting apparatus, pattern inspection apparatus, and pattern image correcting method | — | 2011-09-13 |
| 8004655 | Automatic focus adjusting mechanism and optical image acquisition apparatus | Masataka Shiratsuchi, Yoshinori Honguh, Masatoshi Hirono, Riki Ogawa | 2011-08-23 |
| 7834619 | Magnetic detection device | Hideto Ando | 2010-11-16 |
| 7787686 | Image density-adapted automatic mode switchable pattern correction scheme for workpiece inspection | Junji Oaki | 2010-08-31 |
| 7760349 | Mask-defect inspecting apparatus with movable focusing lens | Akihiko Sekine, Ikunao Isomura, Toshiyuki Watanabe, Riki Ogawa | 2010-07-20 |
| 7627165 | Pattern inspection method and apparatus using linear predictive model-based image correction technique | Junji Oaki, Yuichi Nakatani | 2009-12-01 |
| 7590277 | Pattern inspecting method | Junji Oaki, Ikunao Isomura, Toru Tojo | 2009-09-15 |
| 7572844 | Stimuli-responsive composition, and image-forming method and apparatus using the composition | Koichi Sato, Ikuo Nakazawa, Sakae Suda, Masayuki Ikegami, Sadahito Aoshima | 2009-08-11 |
| 7565032 | Image density-adapted automatic mode switchable pattern correction scheme for workpiece inspection | Junji Oaki | 2009-07-21 |
| 7551273 | Mask defect inspection apparatus | Akihiko Sekine, Ikunao Isomura, Toshiyuki Watanabe, Riki Ogawa | 2009-06-23 |
| 7539350 | Image correction method | Junji Oaki, Yuichi Nakatani | 2009-05-26 |
| 7487491 | Pattern inspection system using image correction scheme with object-sensitive automatic mode switchability | Junji Oaki | 2009-02-03 |
| 7439282 | Stimuli-responsive composition, and image-forming method and apparatus using the composition | Koichi Sato, Ikuo Nakazawa, Sakae Suda, Masayuki Ikegami, Sadahito Aoshima | 2008-10-21 |
| 7379176 | Mask defect inspection apparatus | Akihiko Sekine, Ikunao Isomura, Toshiyuki Watanabe, Riki Ogawa | 2008-05-27 |
| 7359546 | Defect inspection apparatus and defect inspection method | Ikunao Isomura, Junji Oaki, Toru Tojo | 2008-04-15 |
| 7209584 | Pattern inspection apparatus | Hideo Tsuchiya, Kyoji Yamashita, Toshiyuki Watanabe, Kazuhiro Nakashima | 2007-04-24 |
| 7123345 | Automatic focusing apparatus | Riki Ogawa, Toru Tojo | 2006-10-17 |
| 7067590 | Stimuli-responsive composition, and image-forming method and apparatus using the composition | Koichi Sato, Ikuo Nakazawa, Sakae Suda, Masayuki Ikegami, Sadahito Aoshima | 2006-06-27 |
| 7068364 | Pattern inspection apparatus | Mitsuo Tabata, Hideo Tsuchiya, Yasushi Sanada | 2006-06-27 |